1/2晶体罩密封继电器触点参数自动测试系统设计  

Design of Automatic Testing System for Contact Parameters of1/2 Crystal Cover Sealed Relay

作　　者：马航宇 梁慧敏[1] 陈昊[1] 罗福彪 周哲峰 俸钶云 MA Hangyu;LIANG Huimin;CHEN Hao;LUO Fubiao;ZHOU Zhefeng;FENG Keyun(Harbin Institute of Technology,Harbin 150001,China;Guilin Aerospace Electronics Co.,Ltd.,Guilin 541002,China)

机构地区：[1]哈尔滨工业大学,黑龙江哈尔滨150001 [2]桂林航天电子有限公司,广西桂林541002

出　　处：《电器与能效管理技术》2023年第10期54-60,共7页Electrical & Energy Management Technology

基　　金：国家自然科学基金项目(52177134)。

摘　　要：针对1/2晶体罩密封继电器触簧系统在使用传统人工方式进行触点参数测试时,存在精度差、效率低、费时费力和触簧损伤等缺陷,设计并实现一套以某型号1/2晶体罩密封继电器触簧系统为测试对象的触点参数自动测试系统。系统使用机器视觉检测技术自动测试触点间隙,使用电动滑台配合克力计自动测试触点初压力。对同型号继电器触簧样本进行自动测试,实验结果表明,系统触点间隙测试精度高于1μm、触点初压力测试精度为1 mN,能保证继电器装配时触点参数的一致性。To address the shortcomings of poor accuracy,low efficiency,time-consuming and labor-intensive testing,as well as damage to the contact spring of the 1/2 crystal cover sealed relay contact spring system when using traditional manual methods for contact parameter testing,a contact parameter automatic testing system is designed and implemented using a certain type of 1/2 crystal cover sealed relay contact spring system as the testing object.The system uses machine vision detection technology to automatically test the contact gap,and uses an electric sliding table combined with a acrylic meter to automatically test the initial pressure of the contact.The automatic testing is conducted on the contact spring samples of the same type of relay.The experimental results show that the testing accuracy of the system's contact gap is higher than 1μm,and the test accuracy of the contact initial pressure is 1 mN,which can ensure the consistency of contact parameters during relay assembly.

关 键 词：继电器 触点间隙 触点压力 自动测试系统 机器视觉 

分 类 号：TM581[电气工程—电器]