面向CMOS图像传感器应用的列级模数转换器研究进展  

Research Progress of Column-Level ADC for CMOS Image Sensor Applications

作　　者：廖文丽 张植潮 张九龄 蔡铭嫣 陈铖颖 Liao Wenli;Zhang Zhichao;Zhang Jiuling;Cai Mingyan;Chen Chengying(School of Opto-Electronic and Communication Engineering,Xiamen University of Technology,Xiamen 361024,China)

机构地区：[1]厦门理工学院光电与通信工程学院,福建厦门361024

出　　处：《半导体技术》2023年第11期961-971,共11页Semiconductor Technology

基　　金：福建省自然科学基金引导性项目(2023H0052);厦门市重大科技项目(3502Z20221022)。

摘　　要：随着有源像素工艺以及互补金属氧化物半导体(CMOS)集成电路技术迅速发展,CMOS图像传感器(CIS)朝着高分辨率、高动态范围、低功耗、小体积的方向不断发展,在数码相机、汽车驾驶、安防监控、医学等多个领域中逐渐取代原市场主流的电荷耦合器件(CCD)图像传感器。模数转换器(ADC)作为模拟信号和数字信号的转换端口,是CMOS图像传感器中的重要组成部分,其性能的优劣直接决定了CMOS图像传感器的成像质量。对应用于CMOS图像传感器的模数转换器进行了综述,分析了几种主流架构的优缺点,阐述了面临的挑战以及解决方案,最后对未来的发展前景进行了展望。With the rapid development of active pixel technology and complementary metal-oxide semiconductor(CMOS)integrated circuit technology,CMOS image sensors(CISs)are constantly developing in the direction of high resolution,high dynamic range,low power consumption and small size,which have gradually replaced the mainstream charge coupled device(CCD)image sensors in many fields such as digital cameras,car driving,security monitoring and medicine.As a conversion port for analog signals and digital signals,the analog-to-digital converter(ADC)is an important part of CMOS image sensors,and its performance directly determines the imaging quality of CMOS image sensors.The ADC applied to CMOS image sensors is reviewed,the advantages and disadvantages of several mainstream architectures are analyzed,the challenges and solutions are explained,and finally the future development is prospected.

关 键 词：CMOS图像传感器(CIS) 模数转换器(ADC) 单斜(SS)ADC 逐次逼近寄存器(SAR)ADC 循环ADC Sigma-Delta ADC 

分 类 号：TN432[电子电信—微电子学与固体电子学] TN792