基于温升试验对低压成套设备控制柜结构设计的探讨  

Discussion on Structural Design of Control Cabinet of Low-Voltage Complete Equipment Based on Temperature Rise Test

作　　者：张业真 ZHANG Yezhen(Fujian Inspection and Research Institute for Product Quality,Fuzhou 350002,Fujian,China)

机构地区：[1]福建省产品质量检验研究院,福建福州350002

出　　处：《市场监管与质量技术研究》2023年第5期22-26,35,共6页Market Regulation and Quality Technology Research

摘　　要：文中介绍了低压成套开关设备控制柜中固定式与抽出式常见的内部结构形式与布局设计。通过改变开关额定分散系数进行温升测试结果对比,分析两种柜型在内部结构布局设计中存在的不合理之处,以及在实际使用过程中存在的安全隐患,并提出一些能够改进控制柜结构设计的方案与措施,以便能够更好地满足温升测试要求,降低存在的风险,提高设备安全性能。This paper introduces the common internal structure and layout design of the fixed type and the pull-out type in the low-voltage switchgear assembly control cabinet.By changing the rated dispersion coefficient of the switch,the temperature rise test results were compared to analyze the unreasonable place in the internal structure layout design of the two cabinet types,as well as the hidden danger in the process.And some schemes and measures were put forward to improve the structural design of control cabinet so as to better meet the requirements of temperature rise test,reduce existing risks and improve device safety performance.

关 键 词：控制柜 结构设计 温升测试 额定分散系数 

分 类 号：TM591[电气工程—电器]