金刚石压砧内单晶硅高压折射率的椭偏测量  

Ellipsometric Measurement of the Refractive Index of Monocrystalline Silicon in a Diamond Anvil Cell

作　　者：鲍晓艳 邓硕 吕海飞 黎敏[1] BAO Xiaoyan;DENG Shuo;LV Haifei;LI Min(School of Science,Wuhan University of Technology,Wuhan 430070,China)

机构地区：[1]武汉理工大学理学院,武汉430070

出　　处：《光子学报》2023年第11期171-181,共11页Acta Photonica Sinica

基　　金：国家自然科学基金(Nos.11974266,62075174)。

摘　　要：针对高压对顶砧入射角度受限、样品微小的特殊测量条件,设计原位椭偏测量系统,实现450~700 nm光谱范围的小角度椭偏测量。建立光学模型,获得2~9 GPa下单晶硅的折射率,发现单晶硅的折射率随压力增加而增大。与高压拉曼光谱的对比说明椭偏法原位监测材料光学性质变化的可能性。本文研究可为高压下材料的光学常数及其原位测量提供有益补充。High-pressure physics has advanced significantly since its inception,initially being used to study the structure of materials within the Earth.Today,it has applications in various scientific fields,such as chemistry,physics,biology,materials science,and pharmacy.Through the development of advanced instruments and software,high pressure research has become more precise,comprehensive,and complex.Compared to the momentary pressure changes brought by dynamic high pressure shock,static high pressure loading has the advantages of safety,cleanliness,and low response time requirements for detection equipment.In the late 1950 s,high pressure science entered the era of Diamond Anvil Cells(DACs).In the following decades,DAC technology has been continuously improved,including increasing the chamfer of the opposing anvils to further increase pressure,improving the metal gasket materials,and introducing pressure transmission media.These improvements have increased pressure while solving problems such as pressure gradients and sample leakage.The continuous improvement and development of these technologies have not only expanded the upper limit of pressure that experimental techniques can achieve but also greatly promoted the development of high-pressure science.Diamond anvil cells,due to their unique structure,can generate high pressure on a small area and are widely used in studying material properties under high pressure.In-situ optical radiation measurement techniques in diamond anvil cells include high-pressure Raman spectroscopy,high-pressure synchrotron X-ray radiation,photoluminescence spectroscopy,ultraviolet-visible absorption spectroscopy,and infrared spectroscopy.However,most existing optical detection methods for diamond anvils require expensive large-scale detection equipment,such as synchrotron radiation sources.Furthermore,these methods are often focused on the absorption spectrum or photoluminescence properties of the materials themselves without directly measuring the material′s optical constants.This study a

关 键 词：高压 椭偏 光学模型 折射率 单晶硅 

分 类 号：O43[机械工程—光学工程]