CCD满阱自动化检测系统及其在相机研制中的应用  

Automatic CCD Full-well Test System and Its Application in Camera Development

作　　者：林方 刘文清 王煜[3] 常振 司福祺 LIN Fang;LIU Wenqing;WANG Yu;CHANG Zhen;SI Fuqi(School of Environmental Science and Optoelectronic Technology,University of Science and Technology of China,Hefei 230026,China;Key Laboratory of Environmental Optical and Technology,Anhui Institute of Optics and Fine Mechanics,Hefei Institutes of Physical Science,Chinese Academy of Sciences,Hefei 230031,China;Information Materials and Intelligent Sensing Laboratory of Anhui Province,Institutes of Physical Science and Information Technology,Anhui University,Hefei 230039,China)

机构地区：[1]中国科学技术大学环境科学与光电技术学院,合肥230026 [2]中国科学院合肥物质科学研究院安徽光学精密机械研究所环境光学与技术重点实验室,合肥230031 [3]安徽大学物质科学与信息技术研究院信息材料与智能感知安徽省实验室,合肥230039

出　　处：《光子学报》2023年第11期192-203,共12页Acta Photonica Sinica

基　　金：国家重点研发计划(No.2022YFB3904805)。

摘　　要：在相机研制过程中,电路参数的每次调整都伴随着对相机输出满阱的测试,参数调整繁复,满阱测试的次数过多。为获得最佳的满阱输出性能,对电路各项参数进行精确匹配,提高满阱测试的效率,设计了一套自动化满阱性能测试平台。研究了影响电荷耦合器件满阱性能的因素,建立了光子转移曲线模型,提出了一种光子转移曲线快速取点法,并讨论了模型和方法在满阱测试中的应用。搭建了包括光源系统、成像电路、和温度采集系统在内的测试平台,并完成了自动化流程的软硬件设计。将该测试平台应用于在研相机的测试,验证了平台构造和测试方法的正确性,测量精度优于±1.6%,满足科学级相机的研制使用要求。This paper designs an automatic full-well test system based on PTC technique.This system is applied to measure the full-well and readout noise of CCD cameras to improve the development conditions for the imaging circuits design.Scientific CCDs usually have deeper full-well capacity and lower readout noise,making it suitable for measurement instruments with large dynamic range and high accuracy.The project mentioned in this paper is a satellite-born instrument measuring the components of atmosphere,which employs a spectrometer and a camera to capture the spectral image data of the atmosphere.Since the brightness of the target varies in a wide range,the measurement requires a large dynamic range of the camera.In addition,to obtain an adequate image spatial resolution when the camera is scanning along the trail of the satellite,the readout rate of the CCD is determined to be 2.5 MHz.E2V′s scientific product CCD275 is selected to make the new camera.According to the datasheet of CCD275,it has a full-well capacity of over 700 ke-and a maximum readout rate of 5 MHz.However,the maximum readout speed specified in the datasheet is not the speed,at which the CCD full-well performance can be guaranteed.The CCD factories usually measure the full-well capacity at a low readout speed,and obtain the maximum readout speed under the condition that imaging function is achieved.The full-well of a CCD is determined by the storage and transferring capability of the CCD.The charge transferring capability is affected by offset voltage,driving current,and clock phases,which are the design parameters of the imaging circuit in the camera.Theoretical calculations and design references can only provide rough ranges of these circuit parameters.In a low readout speed,these parameters do not significantly affect the full-well transferring capability.However,when the readout speed is increased close to a certain speed,the effect becomes significant and these parameters need to be finely adjusted to keep the full-well performance.Over the cert

关 键 词：电荷耦合器件 光子转移曲线 电路参数匹配 满阱性能 自动测试平台 

分 类 号：TN386.5[电子电信—物理电子学] TP274[自动化与计算机技术—检测技术与自动化装置]