融合美国商业管制清单和专利的技术链关键路径识别研究——以EDA软件领域为例  

Critical Path Identification in Technology Chain by Integrating the U.S. Commerce Control List and Patents: An Example from the EDA Software Field

作　　者：朱宇婧 陈芳[1] 赵萍[1] 王学昭[1,2] Zhu Yujing;Chen Fang;Zhao Ping;Wang Xuezhao(National Science Library,Chinese Academy of Sciences,Beijing 100190;Department of Information Resources Management,School of Economics and Management,University of Chinese Academy of Sciences,Beijing 100190)

机构地区：[1]中国科学院文献情报中心,北京100190 [2]中国科学院大学经济与管理学院信息资源管理系,北京100190

出　　处：《图书情报工作》2023年第21期89-99,共11页Library and Information Service

基　　金：中国科学院文献情报能力建设专项“面向决策应用的智能情报分析模型研究”(项目编号:E2290433);中国科学院战略研究专项“‘两个清单’编制、动态更新等研究支撑”(项目编号:GHJ-ZLZX-2023-19)研究成果之一。

摘　　要：[目的/意义]在美国对华技术出口管制日益升级的背景下,本研究提出一种在专利引文网络中融合美国商业管制清单数据识别关键路径的方法,尝试寻求技术突破或技术替代方案,该方法具有较高实际应用价值。[方法/过程]在专利引文网络中融合商业管制清单数据,在路径组合权重中引入管制权重以衡量技术受到管制的程度,引入语义权重提高路径技术主题一致性;采用动态规划的广度优先搜索网络获得组合权重最大的路径集合;根据路径上所有专利的平均语义将候选关键路径进行聚类,选择各个类中组合权重最大的路径作为不同技术环节上的关键路径。[结果/结论]在EDA软件技术领域的实证结果表明,该方法能够识别领域内5个不同技术环节上受到管制的关键路径,并通过对比引入管制权重前后的结果探讨管制权重在该方法中的重要作用。[Purpose/Significance]This paper proposes a method of identifying critical paths in patent citation networks by integrating the U.S.Commerce Control List(CCL)in response to the mounting U.S.technology export controls on China with the aim of technological breakthroughs or alternatives.The method has high practical value.[Method/Process]The method combined CCL data into the patent citation network and introduced control weight to measure the degree of technology control,which also using semantic weight to improve the consistency of technology topics in the path combination weight.The method also employed dynamic programming and breadthfirst search network to obtain the path with the maximum combination weight.Then,candidate critical paths were clustered based on the average semantics of all patents on the path,and the path with the maximum combination weight in each cluster was chosen as the representative of the critical path on different technology segments.[Result/Conclusion]The empirical results in the EDA software technology field demonstrate that the method can identify critical paths subject to technology controls in five different technology segments.The importance of control weight in this method has been explained by comparing the results before and after the control weight introduction.

关 键 词：关键路径识别 商业管制清单 专利引文网络 EDA 

分 类 号：G255.53[文化科学—图书馆学]