非接触式低无源互调温箱穿仓接口技术  

Contactless low passive intermodulation through-wall technology of temperature chamber

作　　者：陈翔[1] 胡少光 双龙龙 胡天存[1] 崔万照[1] CHEN Xiang;HU Shaoguang;SHUANG Longlong;HU Tiancun;CUI Wanzhao(China Academy of Space Technology(Xi’an),Xi’an 710000,China)

机构地区：[1]中国空间技术研究院西安分院,西安710000

出　　处：《空间电子技术》2023年第6期14-21,共8页Space Electronic Technology

基　　金：国家自然科学基金青年基金项目(编号:61901359);国家重点实验室基金项目(编号:6142411232204)。

摘　　要：高低温循环状态下的无源互调(passive intermodulation,PIM)检测是全面评估航天微波产品PIM性能的必要手段,传统的温箱穿仓波导连接方式在温循PIM检测中时常出现因应力、温变等因素导致检测系统残余PIM恶化的问题,严重影响检测灵敏度和检测效率。针对此,提出一种非接触式低PIM温箱穿仓接口技术。在温箱穿仓部位利用非接触电磁屏蔽原理构建非接触式端口,避免了不良电接触,以实现温箱内外快速稳定的低PIM电连接。理论分析了其中非接触结构的PIM抑制特性,针对Ku频段应用设计研制了温箱穿仓接口并开展了实验验证,实测在长时间温循状态下系统3阶残余PIM<-140dBm@2×100W,获得了稳定的低残余PIM特性,大幅提升了PIM检测性能和检测效率,可广泛推广于各类PIM检测系统应用中。Temperature cycle PIM test is necessary to evaluate the PIM performance of space microwave products.Unfortunately,the traditional temperature chamber s through-wall waveguide connection always cause residual PIM deterioration because of stress,temperature change and other factors,which seriously affects the sensitivity and efficiency of temperature cycle PIM test.To solve this problem,a contactless low PIM through-wall technology is proposed,contactless port is designed for the through-wall structure based on the principle of contactless EM shielding,which avoids the electrical contact factors that cause PIM,by which a kind of low PIM electrical connection of the temperature chamber’s through-wall is achieved.The PIM suppression of the contactless structure is analyzed,and a Ku-band prototype is designed and test.The measured 3 rd residual PIM level is less than-140dBm@2×100W under several temperature cycles,obtaining a stable low residual PIM level,which greatly improves the PIM test performance and efficiency,and can be widely used in various kinds of PIM test applications.

关 键 词：无源互调 非接触 PIM检测 温循 

分 类 号：TN61[电子电信—电路与系统] V443[航空宇航科学与技术—飞行器设计]