抗穗发芽合成小麦改良品系的筛选及遗传分析  

Identification and Genetic Analysis of Improved Synthetic Wheat Lines Showing Resistant to Pre-Harvest Sprouting

作　　者：藏天青 刘玉娥 马春芳 李潇 王希友 郝明[1] 张连全[1] 袁中伟[1] 姜博 刘登才[1] 甯顺腙[1] ZANG Tianqing;LIU Yu′e;MA Chunfang;LI xiao;WANG Xiyou;HAO Ming;ZHANG Lianquan;YUAN Zhongwei;JIANG Bo;LIU Dengcai;NING Shunzong(State Key Laboratory of Crop Gene Exploration and Utilization in Southwest China/Triticeae Research Institute,Sichuan Agricultural University,Chengdu 611130,China)

机构地区：[1]四川农业大学西南作物基因资源发掘与利用国家重点实验室/小麦研究所,成都611130

出　　处：《四川农业大学学报》2023年第6期998-1007,共10页Journal of Sichuan Agricultural University

基　　金：四川省科技厅项目(2023NSFSC0218)。

摘　　要：【目的】筛选抗穗发芽的合成小麦改良品系,分析潜在的相关基因。【方法】6个环境(2年3点)下,对129份改良品系进行了穗发芽抗性的鉴定及评价,同时利用Wheat 55K芯片数据进行全基因组关联分析。【结果】获得3份抗穗发芽品系(发芽指数GI≤0.2;发芽率GR≤40%),分别为红皮品系L2741、L3006、白皮品系L586,得到3个显著关联的位点。【结论】获得的3份抗穗发芽品系可在培育抗穗发芽品种中利用,获得46个可能的候选基因,其中4个基因主要与植物抗逆性有关,推测其在小麦抗穗发芽中起重要作用。【Objective】The objective of this study is to identify and genetically analyze improved synthetic wheat lines showing resistant to pre-harvest sprouting.【Method】Pre-harvest sprouting resistance(PHS)of 129 improved synthetic wheat lines was assessed under six environments.Genome-wide association study(GWAS)using the wheat 55K SNP chip was completed.【Result】Three lines(red wheat lines L2741 and L3006,white wheat line L586)with stable PHS resistance were obtained(germination index(GI)≤0.2;germination rate(GR)≤40%).Three significantly associated intervals with PHS resistance were identified by GWAS.【Conclusion】Three lines with stable PHS resistance will provide new materials for breeding varieties resistant to PHS.Forty-six candidate genes were identified,and 4 of them are primarily associated with plant stress resistance,which might play an important role in PHS.

关 键 词：人工合成小麦改良品系 穗发芽 全基因型组关联分析 

分 类 号：S512.1[农业科学—作物学]