植入性胎盘谱系疾病MRI诊断征象的研究进展  

Research progress in MRI diagnostic signs of placenta accreta spectrum disorders

作　　者：赵维敬[1] 梁宇霆(审校)[1] ZHAO Weijing;LIANG Yuting(Department of Radiology,Beijing Obstetrics and Gynecology Hospital,Capital Medical University.Beijing Maternal and Child Health Care Hospital,Beijing 100006,China)

机构地区：[1]首都医科大学附属北京妇产医院/北京妇幼保健院放射科,北京100006

出　　处：《国际医学放射学杂志》2024年第1期83-87,共5页International Journal of Medical Radiology

基　　金：首都卫生发展科研专项(首发2022-2-2117)。

摘　　要：产前明确诊断植入性胎盘谱系疾病(PAS)并评估其严重程度非常重要。相比超声检查,MRI可以提供更多的有效信息。PAS的MRI诊断征象及其在评分模型中的应用可以准确评估该疾病的严重程度。简述正常胎盘的相关解剖及MRI表现,并就PAS的多种MRI诊断征象及严重程度评估的研究进展进行综述。It is particularly important to achieve a clear prenatal diagnosis and evaluate the severity of placenta accreta spectrum(PAS)disorders.In comparison to ultrasound,MRI can offer more effective information for assessing PAS disorders.MRI diagnostic signs of PAS disorders,along with their application in scoring models,can accurately assess the severity of the disorders.This article not only sketches the relevant anatomy and MRI performances of normal placenta,but also reviews and summarizes the research progress on several MRI diagnostic signs and assessment of severity in PAS disorders.

关 键 词：胎盘 胎盘植入 磁共振成像 

分 类 号：R714.56[医药卫生—妇产科学] R445.2[医药卫生—临床医学]