连接器失效成因探讨  

Discussion on the Causes of Connector Failure

作　　者：吴飞 杨永兴[1] 高海龙 WU Fei;YANG Yongxing;GAO Hailong(CRPREI-EAST,Suzhou 215011,China)

机构地区：[1]工业和信息化部电子第五研究所华东分所,江苏苏州215011

出　　处：《电子产品可靠性与环境试验》2023年第6期89-93,共5页Electronic Product Reliability and Environmental Testing

摘　　要：借助实际案例,通过外观目检、金相切片和扫描电子显微镜(SEM)等物理分析手段,研究了连接器互联电阻变大导致连接器失效的成因。结果表明:公端负极触点与母端金属片没有很好地接触在一起,间隙略微偏大,长期使用过程中,连接器接口偏大可能导致接触电阻增大,该处温度升高发烫,触点金属熔融并伴随一定程度的氧化,进而导致触点发黑,接触电阻进一步增大,最终导致连接器失效。By means of physical analysis such as visual inspection,micro section,scanning electron microscope(SEM),the causes of connector failure due to the increase of connector interconnection resistance are studied combined with practical cases.The results show that negative contact of the male end and the metal sheet of female end are not in good contact with each other,and the gap between the male and female terminal is slightly large.During long-term use,the connector interface is too large may cause the contact resistance to increase,the temperature of the connect part rises and the contact metal melts with a certain degree of oxygenation which leads to the contact blackening,the contact resistance further increases,and eventually leads to the failure of the connector.

关 键 词：连接器 接触电阻 氧化 

分 类 号：TN597.8[电子电信]