基于改进Kruskal-Wallis检验的低压开关电器状态表征参数选择  

Selection of State Characterization Parameters for a Low-voltage Switching Device Based on Improved Kruskal-Wallis Test

作　　者：刘洋[1] 曹云东[1] 刘树鑫[1] LIU Yang;CAO Yundong;LIU Shuxin(Key Laboratory of Special Electric Machines and High Voltage Apparatus of the Ministry of Education,Shenyang University of Technology,Shenyang 110870,China)

机构地区：[1]沈阳工业大学教育部特种电机与高压电器重点实验室,沈阳110870

出　　处：《高电压技术》2024年第2期535-542,共8页High Voltage Engineering

基　　金：辽宁省科技重大专项(2020JH1/10100012)。

摘　　要：由于状态数据的多属性、高维度和大数据量,以及特征参数难以满足正态性和方差齐性检验的事实,低压开关电器的状态表征参数难于选择。针对该问题,基于非参数单体多状态样本的分组状态间秩差异性,以及特征参数Kruskal-Wallis(KW)检验统计量的计算规则和变化趋势,研究论证了单体样本特征参数表征显著性鉴别机理。同时,基于状态序列斜率变化增量和子序列变异增量,提出样本状态时序分类算法,并将该算法与参数鉴别机理相结合,形成单体多状态样本改进KW检验理论。最后,基于改进理论提出低压开关电器状态表征参数选择新方法。以交流接触器为例进行验证,结果表明该文方法适用于具有非线性、非平稳、动态随机分布等特点的低压开关电器状态表征参数选择。实例证明,基于该方法获得状态表征曲线的拟合优度可达0.91,状态划分显著性P值可达8.42848×10–266,表征与分类精度较参数选择前及同类方法提升明显,为下一步研究低压开关电器状态的精确划分与识别奠定了理论基础。Due to the multi attributes,high dimensionality and big data of state data,and the fact that feature parameters cannot meet the normal distribution and variance homogeneity test,the state characterization parameters of a low-voltage switching device is difficult to select.To solve this problem,based on the rank differences between grouping states of a single nonparametric multi-state sample,as well as the calculation rules and change trend of Kruskal Wallis(KW)test statistics of the feature parameter,this paper studies and demonstrates the identification mechanism of characteristic pa-rameters of a single sample.At the same time,based on the increment of slope change in the state sequence and the increment of subsequence variation,a sample state segmentation algorithm is proposed,and this algorithm is combined with the parameter identification mechanism to form an improved KW test theory for a single multi-state sample.Finally,a new method of selecting parameters for the state characterization of low-voltage switching devices is proposed based on the improved theory.An AC contactor is used to verify the method,which shows that this method is suitable for state characterization parameter selection of low-voltage switching devices with nonlinear,non-stationary and dynamic random distribution characteristics.It is proved that the goodness of fit of the state characterization curve obtained based on this method can reach 0.91,and the P-value of state segmentation significance can reach 8.42848×10–266,which improves the characterization and segmentation accuracy significantly compared with that before parameters selection and the similar method.The results lay a theoretical foundation for the further research on the accurate segmentation and identification of the state of low-voltage switching devices.

关 键 词：低压开关电器 状态表征 参数选择 Kruskal-Wallis检验 状态划分 

分 类 号：TM564[电气工程—电器]