飞行时间二次离子质谱在指纹分析中的研究进展  

Application of Time-of-Flight Secondary Ion Mass Spectrometry in Fingerprint Analysis

作　　者：满瀚泽 陈诺 孙佳磊 秦歌 赵雅彬[1,3] MAN Han-ze;CHEN Nuo;SUN Jia-lei;QIN Ge;ZHAO Ya-bin(Academy of Forensic Science,People’s Public Security University of China,Beijing 100038,China;Criminal Detachment of West Branch of Beijing Public Security Bureau,Beijing 100055,China;Public Security Behavioral Science Laboratory,People’s Public Security University of China,Beijing 100038,China)

机构地区：[1]中国人民公安大学侦查学院,北京100038 [2]北京市公安局西城分局刑事侦查支队,北京100055 [3]中国人民公安大学公共安全行为科学实验室,北京100038

出　　处：《分析测试学报》2024年第2期338-350,共13页Journal of Instrumental Analysis

基　　金：中国人民公安大学基本科研业务项目(2023JKF01ZK02);公安部技术研究计划项目(2023JSZ03)。

摘　　要：指纹作为接触类犯罪案件现场最常见的痕迹之一,基于其形态学价值及承载的物质进行分析是个体识别、侦查破案的重要手段。飞行时间二次离子质谱技术(TOF-SIMS)是一种兼具高质量分辨率和高空间分辨能力的表面分析技术,能够同时获得待测物质的质谱信息和成像分布。相较于其他理化分析技术,TOF-SIMS所具备的快速检验、无需前处理、原位近无损分析等优势使其逐渐成为指纹分析领域的前沿课题。该文基于TOF-SIMS在成像增强、物质分析、犯罪信息挖掘等指纹分析领域的研究现状展开综述,分析其在公安实战中的应用前景,以期为该技术在指纹检验领域的推广奠定基础。Fingerprints are one of the most prevalent forms of evidence at the scene of contact-based crimes.By analyzing their morphological characteristics and the substances they contain,fingerprints facilitate individual identification and the resolution of criminal cases.Time-of-flight secondary ion mass spectrometry(TOF-SIMS)is a surface analysis technique that combines high quality resolution and high spatial resolution to simultaneously obtain mass spectra information and imaging distribution of the substance to be measured.Compared with other physicochemical analysis techniques,TOF-SIMS is becoming a frontier topic in fingerprint analysis due to its ability of rapid inspection,no pretreatment,and in situ near-nondestructive.We review the current research status of TOFSIMS in the field of fingerprint analysis(specifically focusing on imaging enhancement,material analysis,and criminal information mining)and analyze its application prospect in investigating crime,in order to promote the spread of this technology in the domain of fingerprint examination.

关 键 词：飞行时间二次离子质谱(TOF-SIMS) 质谱成像 指纹 应用研究 

分 类 号：O657.6[理学—分析化学] P632.8[理学—化学]