成像板法核材料镀层均匀性测量  

Uniformity Measurement of Nuclear Material Plating Layer by Imaging Plate

作　　者：韩子杰[1] 羊奕伟[1] 朱通华[1] 鹿心鑫[1] HAN Zijie;YANG Yiwei;ZHU Tonghua;LU Xinxin(Institute of Nuclear Physics and Chemistry,ChinaAcademy of Engineering,Mianyang 621900,China)

机构地区：[1]中国工程物理研究院核物理与化学研究所,绵阳621900

出　　处：《核电子学与探测技术》2023年第6期1201-1206,共6页Nuclear Electronics & Detection Technology

基　　金：国家自然科学基金(No.12075216)。

摘　　要：均匀性是核材料镀层的重要参数,为了精确获取核材料镀层均匀性信息,选择富士公司的TR-2025型成像板作为探测器,Typhoon FLA9000型扫描仪作为信号读出设备,根据成像板灰度值与入射粒子强度成正比的特点,依据GB/T 13694—92《α-,β-平板标准源通用技术条件》对均匀性的定义,测量并得到了浓缩铀镀层不均匀度。分析了不同退激时间对均匀性测量的影响。结果表明,退激时间的差异对不均匀性测量影响可以忽略,镀层不均匀度在0.17~0.18之间波动。成像板法实现了镀层全覆盖,克服了选点测量代表性不足的问题,属于相对测量,避免了成像板效率标定问题,该方法能够获取核材料镀层表面全域三维形貌,为精密物理测量提供支撑。The non-uniformity of the nuclear material plating layer is an important parameter in highprecision fission cross section measurement using ionization chamber.In this paper,some experiments were carried out to determine the non-uniformity(defined by GB/T 13694-92)of the areal density of enriched uranium plating layer.Imaging plate(IP)is a two-dimensional radiation detector with high sensitivity to the alpha particles emitted from the surface of the nuclear material plating layer like uranium.In this work,the nuclear material plating layer was covered by an imaging plate(provided by Fuji Film Co.,Ltd.)for a few minutes,then the imaging plate was de-excited and the corresponding twodimensional light density was read out by the Typhoon FLA9000 scanner system(provided by GE).The light density is proportional to alpha intensity,which is proportional to the areal density of the ultra-thin(around 0.3 mg/cm~2)nuclear material plating layer.Finally,the non-uniformity of the nuclear material plating layer can be determined by analyzing the distribution of the light density.Results indicate that the non-uniformity of enriched uranium plating layer is between 0.17 and 0.18,and the de-excitation time of the IP has neglectable impact on the non-uniformity.This method with IP could cover the entire plating layer in a single measurement thus overcome the lack of representiveness in the spot measurement.It is a relative measurement so the absolute efficiency calibration of IP is not obligatory.The method established in this study has the potential to get the 3D topography of the entire plating layer of nuclear material,which could strongly support the precise measurement of nuclear data.

关 键 词：核材料镀层 成像板 不均匀度 

分 类 号：O571.32[理学—粒子物理与原子核物理]