基于腔衰荡光谱技术的半导体光放大器增益测量  

Gain measurement of semiconductor optical amplifier by cavity ring-down spectroscopy technique

作　　者：景志广 陈海燕 JING Zhiguang;CHEN Haiyan(School of Physics and Optoelectronic Engineering,Yangtze University,Jingzhou 434023,China)

机构地区：[1]长江大学物理与光电工程学院,湖北荆州434023

出　　处：《高师理科学刊》2024年第2期53-55,共3页Journal of Science of Teachers＇College and University

摘　　要：提出并验证一种基于腔衰荡光谱(CRDS)技术的半导体光放大器(SOA)增益测量方法.实验系统包括经RF信号调制的DFB激光器、半导体光放大器、环形器、光纤布拉格光栅、耦合器、温度控制器、光电探测器及示波器.导出了半导体光放大器增益与腔衰荡时间之间的函数关系式.结果表明,腔衰荡时间是半导体光放大器增益的函数,增益是波长的函数,给出了一种测量SOA增益的新方法及技术可行性.A novel method to measure the gain of semiconductor optical amplifier(SOA)by cavity ring-down spectroscopy(CRDS)technique is proposed and experimentally demonstrated.The experimental system consists of a DFB laser modulated by RF signal,a SOA,a circulator,a fiber Bragg grating,two couplers,a temperature controller,a photo detector,and an oscilloscope.The function relationship between the gain of SOA and the cavity ring-down time is derived.The results showed that the cavity ring-down time is a function of SOA gain,which is a function of wavelength.Provides a new method for measuring SOA gain and the technical feasibility.

关 键 词：衰荡光谱 半导体光放大器 腔衰荡时间 增益测量 

分 类 号：O47[理学—半导体物理]