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作 者:程一飞 吴心竹 吴海峰 邓博文 CHENG Yifei;WU Xinzhu;WU Haifeng;DENG Bowen(School of Computer and Information,Anqing Normal University,Anqing 246133,China)
机构地区:[1]安庆师范大学计算机与信息学院,安徽安庆246133
出 处:《安庆师范大学学报(自然科学版)》2023年第4期79-83,共5页Journal of Anqing Normal University(Natural Science Edition)
摘 要:系统芯片测试数据量大,为了有效减少测试数据,本文提出了一种基于划分组参考数的差值编码压缩及解压缩方案。首先将测试数据划分成若干位0后接1的0游程和若干位1后接0的1游程,再将划分后的游程序列平均分成若干组,之后在每组中选取一类合适的游程长度作为参考数,再将划分游程长度与参考数作差值并编码,充分考虑到了游程长度之间的关联性。将该方法应用于ISCAS89部分电路,实验结果表明本文方法的压缩率要优于经典的Golomb码、FDR码、EFDR码等方案,对测试数据有很好的压缩效果。The test data on the system-on-chip is characterized by a large amount of data,and in order to effectively re-duce the test data,a differential encoding compression and decompression scheme based on dividing the group reference num-ber is proposed.The scheme proposed in this paper first divides the test data into a number of bits of 0 followed by a bit of 1 of 0 runs and a number of bits of 1 followed by 0 of 1 runs.Then it divides the divided run sequence into several groups equal-ly,and then selects a suitable class of run-length in each group as the reference number.After that,it differentiates the length of the divided tour with the reference number and codes the results,which takes the correlation between the run-length and the reference number into account.The method is applied to the ISCAS 89 part of the circuit,and the experimental results prove that the compression rate of this method is better than that of the classic Golomb code,FDR code,EFDR code and other schemes,and has a good compression effect on the test data.
分 类 号:TP306.2[自动化与计算机技术—计算机系统结构]
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