Simultaneous microwave characterization of wafer-level optoelectronic transceiver chips based on photonic sampling and mapping  

作　　者：Yutong HE Xinhai ZOU Ying XU Zhihui LI Naidi CUI Junbo FENG Yali ZHANG Zhiyao ZHANG Shangjian ZHANG Yong LIU Ninghua ZHU 

机构地区：[1]Research Center for Microwave Photonics,State Key Laboratory of Electronic Thin Films and Integrated Devices,School of Optoelectronic Science and Engineering,University of Electronic Science and Technology of China,Chengdu 610054,China [2]Chongqing United Microelectronics Center(CUMEC),Chongqing 400031,China [3]Xiongan Institute of Innovation,Chinese Academy of Sciences,Xiongan 071899,China

出　　处：《Science China(Information Sciences)》2024年第2期333-334,共2页中国科学（信息科学）（英文版）

基　　金：This work was supported by National Natural Science Foundation of China(Grant No.61927821);Fundamental Research Funds for the Central Universities(Grant No.ZYGX2019Z011).

摘　　要：Photonic integrated circuits(PICs)promise future parallelism growths of high-performance communication,computation,and offer unprecedented bandwidth scalability with reduced power consumption as a viable replacement for an electrical wire with an optoelectronic transceiver consisting of a transmitter and a receiver integrated on the same wafer.This wafer-level photonic integration,however,raises challenges for processing optical-electrical(O-E)and electricaloptical(E-O)characterization,which is crucial in chip fabrication and optimization[1].

关 键 词：OPTOELECTRONIC TRANSCEIVER CHARACTERIZATION 

分 类 号：TN40[电子电信—微电子学与固体电子学]