多封装LCR元件一体式自动测试系统的设计  

Design of Integrated Automatic Test System for Multi Package LCR Element

作　　者：申永青[1] 康立鹏 任翔[1] 殷鹏毅 SHEN Yongqing;KANG Lipeng;REN Xiang;YIN Pengyi(Aerospace Science and Industry Defense Technology Research Testing Center,Beijing 100854)

机构地区：[1]航天科工防御技术研究试验中心,北京100854

出　　处：《舰船电子工程》2023年第11期170-173,219,共5页Ship Electronic Engineering

摘　　要：在元器件鉴定实验室的实际使用场景中,对于小批量多封装的LCR元件快速适配综合参数自动测试需求明显。文章从测试工装设计、多链路射频测试通道切换设计、综合参数自动测试平台设计等方面介绍了一种多封装LCR元件一体式综合测试系统,具有操作简单、兼容性强、测试精度高等优点。In the actual use scenario of the component identification laboratory,there is an obvious demand for the rapid adap⁃tation of LCR components with small batches and multiple packages,and the automatic testing of comprehensive parameters.This paper introduces a multi package LCR element integrated test system from the aspects of test tooling design,multi link RF test chan⁃nel switching design,integrated parameter automatic test platform design which has the advantages of simple operation strong com⁃patibility and high test accuracy.

关 键 词：多封装 LCR 元器件可靠性 自动测试 

分 类 号：TB97[一般工业技术—计量学]