一种新型电光晶体半波电压测量方法研究  

Novel half-wave voltage measurement method for electro-optical crystal

作　　者：王佳荣 贺博[1] Wang Jiarong;He Bo(School of Electrical Engineering,Xi′an Jiaotong University,Xi′an 710049,China)

机构地区：[1]西安交通大学电气工程学院,西安710049

出　　处：《仪器仪表学报》2023年第10期13-21,共9页Chinese Journal of Scientific Instrument

基　　金：国家自然科学基金(61571357)项目资助。

摘　　要：本文通过分析晶体电光效应及折射率随电场变化规律,建立了电光调制数学模型并提出一种新的半波电压测量方法。该方法基于晶体两端所加电压幅值与系统输出波形之间数学模型,通过确定输出波形失真临界点推演晶体半波电压。为优化系统,分析了半波电压附近输出波形特性及光源、电源和时间分辨率与系统误差之间的关系并提出了两种优化方案——时间分辨率优化及对称优化。时间分辨率优化的方式通过放大单个波形细节可降低数据离散程度及误差。对称优化则是利用半波电压附近对应波形极值点对称特性,通过多次采样取平均或中值的方法降低误差。结果表明,临界值法是一种结构简单且有效的测量半波电压的方法,其优化方案在降低数据波动及误差方面效果良好。By analyzing the electro-optical effect of crystal and varied refractive index with electric field,a mathematical model of electrooptical modulation is established and a new half-wave voltage measurement method is proposed.Based on the mathematical model between the amplitude of voltage applied at both ends of the crystal and the output waveform of system,the half-wave voltage of crystal is deduced by determining the output distortion point.The characteristics of output waveform near the half-wave voltage and the relationship among the light source,power supply,time resolution and the system error are analyzed.Accordingly,two optimization schemes based on time resolution optimization and symmetric optimization are proposed,respectively.Specifically,the time resolution optimization amplifies individual waveform details to reduce data dispersion and error.While the symmetric optimization is to use the symmetry characteristics of corresponding waveform extreme points near the half-wave voltage and take the average or median value through multiple samples to reduce the error.The results show that the critical value method is a simple and effective method for measuring half-wave voltage,whose optimization scheme is efficient in reducing data fluctuation and error.

关 键 词：折射率椭球 半波电压 临界值法 电光效应 调制特性 

分 类 号：TH741[机械工程—光学工程] TM452[机械工程—仪器科学与技术]