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作 者:路文超 段建东[1] 成林 郭琳云 李再男 LU Wenchao;DUAN Jiandong;CHENG Lin;GUO Linyun;LI Zainan(School of Electrical Engineering,Xi’an University of Technology,Xi’an 710052,China;State Grid Shaanxi Electric Power Research Institute,Xi’an 710100,China;Xi’an Xinghui Electric Power Technology Co.,Ltd.,Xi’an 710116,China)
机构地区:[1]西安理工大学电气工程学院,西安710052 [2]国网陕西省电力公司电力科学研究院,西安710100 [3]西安兴汇电力科技有限公司,西安710116
出 处:《高压电器》2024年第3期8-16,共9页High Voltage Apparatus
基 金:国家自然科学基金项目(U1866201,51877174)。
摘 要:一二次融合技术使得配电开关中二次智能传感单元近距离布置于一次高压电磁环境,配电开关因为电磁干扰产生大量故障。文中利用可控电弧放电原理,针对某型号10 k V一二次融合配电开关搭建了暂态电磁干扰模拟试验平台,获得了该户外一二次融合配电开关干扰信号,其中重点研究了智能传感器附近空间磁场规律;对配电终端(FTU)进行了屏蔽效能分析,计算了传感器合并单元电源线受扰情况。结果表明:一二次融合配电开关中智能传感器可能在持续强暂态电磁骚扰下发生严重故障,文中所研究的电磁暂态模拟试验系统可对智能传感器抗强电磁干扰能力进行考核,现有标准不能满足一二次融合结构下智能传感类设备抗强电磁干扰能力检测需求。The primary and secondary fusion technology makes the arrangement of secondary intelligent sensor unit in the distribution switch close to the primary high-voltage electromagnetic environment,and the distribution switch has a large number of faults due to electromagnetic interference.In this paper,based on the principle of controlled arc discharge,a transient electromagnetic interference simulation test platform for a 10 kV primary and secondary fu-sion distribution switch is set up,and the interference signal of the outdoor primary and secondary fusion distribution switch is obtained,in which the law of spatial magnetic field near the intelligent sensor is mainly studied.The shield-ing effectiveness of the distribution terminals(FTU)is analyzed,and the interference of power line of the sensor merg-ing unit is calculated.The results show that the intelligent sensor in the primary and secondary fusion distribution switch may have serious fault under the continuous strong transient electromagnetic disturbance.The electromagnetic transient simulation test system studied in this paper can check the anti-strong electromagnetic interference ability of intelligent sensor,and the existing standards cannot meet the detection requirements of anti-strong electromagnetic interference ability of intelligent sensor equipment under the primary and secondary fusion structure.
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