黑洞X射线双星中X射线反射成分的研究进展  

The Research Progress of the Re ection Process in Black-Hole X-ray Binaries

作　　者：靳沛 张国宝 王建成[1,2,3] JIN Pei;ZHANG Guo-bao;WANG Jian-cheng(Yunnan Observatories,Chinese Academy of Sciences,Kunming 650011,China;University of Chinese Academy of Sciences,Beijing 100049,China;Key Laboratory for the Structure and Evolution of Celestial Objects,Chinese Academy of Science,Kunming 650011,China)

机构地区：[1]中国科学院云南天文台,昆明650011 [2]中国科学院大学,北京100049 [3]中国科学院天体结构与演化重点实验室,昆明650011

出　　处：《天文学进展》2024年第1期58-75,共18页Progress In Astronomy

基　　金：中国载人航天工程巡天空间望远镜专项科学研究经费。

摘　　要：反射是研究黑洞X射线双星的一个重要工具,有助于理解强引力场中所独有的许多物理过程。综合了观测和理论方面的研究,探讨了黑洞X射线双星中X射线反射成分的最新进展:(1)介绍了反射成分的相关物理过程和能谱形态特征;(2)回顾了近年来在黑洞X射线双星不同能谱态中发现的反射成分及其特征;(3)回顾了反射模型的发展历史,并着重介绍了现有的反射模型,其中特别关注了最近发展起来的relxill模型;(4)探究了反射成分研究中的一些难点和挑战,例如吸积盘厚度和冕区性质的不确定性;(5)对未来黑洞X射线双星反射成分的研究进行了展望。The reflection phenomenon is an important aspect in the study of black hole X-ray binaries,which helps to understand many unique physical processes in strong gravitational fields.In this paper,we present a comprehensive overview of the latest developments in the reflection components of black-hole X-ray binaries,covering observational and theoretical research.We begin by introducing the concept and formation mechanism of the reflection components.Subsequently,we summarize the recent discoveries of reflection components in various spectral states of black hole X-ray binaries and explore their physical properties.Next,we provide a detailed overview of the existing reflection models,with a particular emphasis on the recently developed“relxill”model.In addition,we also discuss some of the challenges and difficulties associated with studying reflection components,such as the uncertainty surrounding the thickness of the accretion disk and the properties of the corona.Finally,we conclude with a discussion of future research directions in the study of reflection components in black-hole X-ray binaries.

关 键 词：黑洞X射线双星 吸积 反射 

分 类 号：P145.2[天文地球—天体物理]