一种用于SIP芯片的IO功能测试方法及装置  

A Test Method and Device of IO Functional for SIP Chip

作　　者：吴忠秉 王小龙 姚尧 WU Zhongbing;WANG Xiaolong;YAO Yao(Wuxi Hope Microelectronics Co.,Ltd.,Wuxi 214035,China;China Key System&Integrated Circuit Co.,Ltd.,Wuxi 214072,China)

机构地区：[1]无锡华普微电子有限公司,江苏无锡214035 [2]中科芯集成电路有限公司,江苏无锡214072

出　　处：《微型电脑应用》2024年第3期169-171,共3页Microcomputer Applications

摘　　要：针对目前SIP芯片的IO功能测试依靠的ATE测试机价格昂贵,使用不便,以及人工测试效率低、易出错的问题,提出一种用于SIP芯片的IO功能测试方法及装置的设计方案。结合IO功能测试特征,利用辅助测试模块、互联电路板和上位机,构建出了该测试方法及装置的核心组成部分。该系统能够满足不同封装类型的SIP芯片的使用,根据实际测试情况,可任意配置测试启动项,提升测试效率,并降低了由于人工参与而引起的测试出错的概率,同时能够方便地记录测试数据,利于后期的追踪查验。Aiming at the problems of IO function test of SIP chip depends on ATE test machine,which is expensive,inconvenient to use,and the manual test efficiency is low and easy to make mistakes,a design scheme of IO function test method and device for SIP chip is proposed.Combined with the characteristics of IO function test,the core components of the test method and device are constructed by using auxiliary test module,interconnecting circuit board and upper computer.The system can meet the use of SIP chips with different packaging types.According to the actual test situation,the test startup items can be configured arbitrarily to improve the test efficiency,reduce the probability of test errors caused by manual participation,and conveniently record the test data for later tracking and inspection.

关 键 词：SIP芯片 IO功能测试 自动化 测试方法 

分 类 号：TN407[电子电信—微电子学与固体电子学]