基于自研ASIC芯片HEPS中硅微条探测器读出电子学原型系统设计与测试  

Design and Test of Readout Electronics Prototype System of Silicon Microstrip Detector Based on ASIC Chip in HEPS

作　　者：杨宗信 李航旭 胡创业[1,2] 周杨帆 陈一鸣[3] 郑波 YANG Zongxin;LI Hangxu;HU Chuangye;ZHOU Yangfan;CHEN Yiming;ZHENG Bo(School of Nuclear Science and Technology,University of South China,Hengyang 421001,China;Key Laboratory of Advanced Nuclear Energy Technology Design and Safety,Ministry of Education,Hengyang 421001,China;Institute of High Energy Physics,Chinese Academy of Sciences,Beijing 100049,China)

机构地区：[1]南华大学核科学与技术学院,衡阳421001 [2]先进核能技术设计与安全教育部重点实验室,衡阳421001 [3]中国科学院高能物理研究所,北京100049

出　　处：《核电子学与探测技术》2024年第1期51-60,共10页Nuclear Electronics & Detection Technology

基　　金：南方科技大学材料基因组大科学装置平台衍射及荧光探测模块(E190YHHD10)。

摘　　要：时间分辨X射线粉末衍射技术是探测物质晶体结构及其演变的重要手段。单光子计数型硅微条探测器因其灵敏度高和死时间低,在高能同步辐射光源(HEPS)的X射线粉末衍射实验中发挥着重要作用。研制适用于单光子计数型一维硅微条探测器的专用ASIC读出芯片(SSDROC)及其读出电子学系统,并采用一种新标定方法解决了SSDROC各通道对同一输入输出响应不一致的问题,该方法可显著提高各通道数据一致性并减小衍射实验数据的统计误差。探测器完成各项性能测试,结果表明整体系统线性优秀、能量分辨能力强、噪声低以及计数率高,为将来大覆盖角度一维硅微条探测器系统研制奠定坚实基础。Time-resolved X-ray powder diffraction technology is an important means of detecting the crystal structure and evolution of substances.Single-photon-counting silicon microstrip detectors play a crucial role in X-ray powder diffraction experiments at the High Energy Photon Source(HEPS)due to their high sensitivity and low dead time.Our team has developed an Application Specific Integrated Circuit(ASIC)readout chip called the Silicon Strip Detector Readout Circuit(SSDROC),along with its corresponding readout electronics system,specifically designed for one-dimensional single-photoncounting silicon microstrip detectors.We have also adopted a new calibration method to address the issue of inconsistent channel responses in the SSDROC when subjected to the same input.This method significantly improves the data consistency across channels and reduces the statistical error in diffraction experimental data.The detector has undergone various performance tests,and the results indicated excellent linearity,high energy resolution capability,low noise,and a high counting rate for the overall system.These findings lay a solid foundation for the future development of one-dimensional silicon microstrip detector systems with wide coverage angles.

关 键 词：单光子计数 硅微条探测器 ASIC芯片 读出电子学 二次阈值标定 

分 类 号：TL816.1[核科学技术—核技术及应用]