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作 者:程晓昱 解晨雪 刘宇伦 白瑞雪 肖南海 任琰博 张喜林 马惠 蒋崇云 Xiaoyu Cheng;Chenxue Xie;Yulun Liu;Ruixue Bai;Nanhai Xiao;Yanbo Ren;Xilin Zhang;Hui Ma;Chongyun Jiang(College of Electronic Information and Optical Engineering,Nankai University,Tianjin 300350,China;School of Physical Science and Technology,Tiangong University,Tianjin 300387,China)
机构地区:[1]College of Electronic Information and Optical Engineering,Nankai University,Tianjin 300350,China [2]School of Physical Science and Technology,Tiangong University,Tianjin 300387,China
出 处:《Chinese Physics B》2024年第3期112-117,共6页中国物理B(英文版)
基 金:Project supported by the National Key Research and Development Program of China(Grant No.2022YFB2803900);the National Natural Science Foundation of China(Grant Nos.61974075 and 61704121);the Natural Science Foundation of Tianjin Municipality(Grant Nos.22JCZDJC00460 and 19JCQNJC00700);Tianjin Municipal Education Commission(Grant No.2019KJ028);Fundamental Research Funds for the Central Universities(Grant No.22JCZDJC00460).
摘 要:Mechanically cleaved two-dimensional materials are random in size and thickness.Recognizing atomically thin flakes by human experts is inefficient and unsuitable for scalable production.Deep learning algorithms have been adopted as an alternative,nevertheless a major challenge is a lack of sufficient actual training images.Here we report the generation of synthetic two-dimensional materials images using StyleGAN3 to complement the dataset.DeepLabv3Plus network is trained with the synthetic images which reduces overfitting and improves recognition accuracy to over 90%.A semi-supervisory technique for labeling images is introduced to reduce manual efforts.The sharper edges recognized by this method facilitate material stacking with precise edge alignment,which benefits exploring novel properties of layered-material devices that crucially depend on the interlayer twist-angle.This feasible and efficient method allows for the rapid and high-quality manufacturing of atomically thin materials and devices.
关 键 词:two-dimensional materials deep learning data augmentation generating adversarial networks
分 类 号:TB34[一般工业技术—材料科学与工程] TP391.41[自动化与计算机技术—计算机应用技术]
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