等离子体直读光谱法同时测定岩石中15个痕量稀土元素  

THE SIMULTANEOUS DETERMINATION OF 15 TRACE RARE EARTH ELEMENTS IN ROCKS BY PLASMA ATOMCOMP DIRECT READING SPECTROMETER SYSTEM

作　　者：袁玄晖[1] 阙松娇 伍新宇 殷宁万 Yuan Xuan-hui

机构地区：[1]中国地质科学院岩矿测试技术研究所

出　　处：《岩矿测试》1983年第2期127-129,I0003,共4页Rock and Mineral Analysis

摘　　要：近年来,着地质学科的研究需要,稀土元素的分析手段不断向深度发展。为了制作稀土球粒陨石标准化分布型式图,要求准确测定痕量稀土元素,同时还由于各种岩石的基体变化不一,造岩元素所产生的谱线干扰以及可变的背景干扰都给痕量稀土元素的测定带来困难,所以,一般都需要进行预处理,将岩石的主元素分离,并使稀土元素相对浓缩。 本文介绍的方法是在原来的熔样和阳离子交换树脂分离的基础上,利用Jarrell—Ash1160等离子体多道直读分光计对15个稀土元素进行同时测定。A method for the deteimination of rare earth elements at chondritic abundance levels is described. Dissolution of rock samples is accomplished by sodium peroxide fusion. Rare earth elements are separated from matrix concomitants and preconcentrated by cation exchange employing No. 1 resin. The analysis of the samples is performed on a Jarrell-Ash model 1160 Atom-Comp spectrometer with 60 channels. A DEC PDP 11/23 minicomputer controls the ICAP spectrometer and is interfaced to a LA-120 DECwriter for data reporting. A precision of 1-5.5%(RSD) was attained. Analyses of several hundreds of rock samples showed that the method is well suited to the routine simultaneous determination of 15 rare earth elements.

关 键 词：痕量稀土元素 背景干扰 直读光谱法 谱线干扰 造岩元素 地质学科 等离子体 分光计 

分 类 号：O65[理学—分析化学]