基板玻璃铂金通道装备寿命研究  

Lifetime Analysis of Substrate Glass Platinum Channel Equipment

作　　者：王梦龙 徐剑 杨威 俞超 王苍龙 WANG Menglong;XU Jian;YANG Wei;YU Chao;WANG Canglong(Caihong Display Devices Company Limited,Xianyang 712000,China;National Engineering Research Center of Flat Display Glass Technology,Xianyang 712000,China)

机构地区：[1]彩虹显示器件股份有限公司,咸阳712000 [2]平板显示玻璃工艺技术国家工程研究中心,咸阳712000

出　　处：《玻璃》2024年第4期12-16,共5页Glass

基　　金：陕西省厅市联动重点项目课题资助2022GD-TSLD-02。

摘　　要：基于铂铑合金材料高温氧化原理,通过对停运线体的系统性解析,结合铂金通道基本结构和运行工艺特点,开展寿命失效问题的关联性调查与分析,明确了通道失效的核心区域位于澄清段的法兰根部本体附近,并通过大量数据的采集与比对,建立起了通道本体失效断裂的多变量数学关系式,不仅可以实现对在线装备基体衰减状态及剩余寿命的实时评测与估算,也为后续线体更长寿命的设计提供支持。Based on the principle of high-temperature oxidation of platinum rhodium alloy materials,a systematic analysis was conducted on the shutdown line body,combined with the basic structure and operating process characteristics of platinum channels,to investigate and analyze the correlation between life failure issues.It was determined that the core area of channel failure is located near the flange root of the clarification section.Through the collection and comparison of a large amount of line body analysis data,a multivariate mathematical relationship between channel equipment failure and fracture was established,not only can real-time evaluation of the attenuation status and remaining lifespan of online equipment be achieved,but it also provides support for the design of longer lifespan of subsequent line bodies.

关 键 词：氧化挥发 侵蚀 极限电流 损耗速率 

分 类 号：TQ171[化学工程—玻璃工业]