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作 者:纪文宇[1] 张汉壮[1] JI Wenyu;ZHANG Hanzhuang(College of Physics,Jilin University,Changchun,Jilin 130012)
出 处:《物理与工程》2024年第1期30-34,66,共6页Physics and Engineering
摘 要:自从麦克斯韦第一次提出位移电流这一概念之后,其在薄膜表征中便得到广泛的应用。然而,在课堂教学中,极少涉及位移电流的测试原理及相关应用讲解,更缺少对其实际应用的介绍。本文从位移电流的测试原理出发,联系实际应用,提出了基于周期性阶跃电压驱动的电流测量(CPSIV)的新方法。这将有效地加深学生对于位移电流物理本质的深入理解。同时,我们以量子点发光二极管(QLED)为平台,对这一新的测试方案进行了实验验证。针对其中空穴传输层薄膜的缺陷特性及其对器件性能的影响进行了表征,揭示了器件的发光开启机制,证实了我们方案的可靠性。Since Maxwell first proposed the concept of displacement current,it has been widely used in thin film characterization.However,in classroom teaching,the testing principles and related applications of displacement current are seldom covered,and its practical applications are even more lacking.In this paper,a new method through current measurement by a periodic stepwise-increased voltage(CPSIV)is proposed from the testing principles of displacement current,in connection with practical applications.This will effectively expand studentsin-depth understanding of the physical nature of displacement current.Meanwhile,we experimentally validated this new testing scheme using quantum dot light-emitting diodes(QLEDs)as a platform.The defect properties of its hole transport layer film and its effect on the device performance were characterized,revealing the luminescence turn-on mechanism of the device.All the above results confirm the reliability of our scheme.
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