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作 者:Joon Kiat Kang Kim Yong Lim Chorng Haur Sow
机构地区:[1]Department of Physics,National University of Singapore,Singapore 117542,Singapore
出 处:《Nano Research》2024年第5期4489-4497,共9页纳米研究(英文版)
基 金:the generous support from the National University of Singapore Faculty of Science under grant E14100009101.
摘 要:Defect fluorescence from high aspect ratio semiconductor nanowires typically displays a weak polarization parallel to the nanowire’s long axis due to dielectric mismatch in high aspect ratio media.Instead,anomalous 2.2 eV defect fluorescence distinctly polarized perpendicular to the nanowire is observed and measured from carbon-incorporated zinc oxide nanowires.These observations are significant because polarized defect emissions with consistent polarization on a mesoscopic scale are uncommon.Through a systematic study and comparison of experimental results with density functional theory calculations,an oriented defect complex comprising carbon substituting on an oxygen site and an oxygen vacancy(CO-VO)is deduced to be responsible for the anomalous yellow fluorescence,demonstrating a method for relating atomic-scale defect geometry to mesoscopic properties.The anomalous emission can appear in both green-and red-fluorescing nanowires grown with different carbon concentrations,verifying the independence and uniqueness of the 2.2 eV emission.This allows for polarization-dependent emission wavelength selection from a single nanowire.
关 键 词:anomalous polarization DEFECTS FLUORESCENCE zinc oxide carbon
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