半导体激光器抗辐照性能无损检测系统的研制  

Development of a non-destructive testing system for the irradiation resistance of semiconductor lasers

作　　者：王双争 曹军胜[1] 于松群 高志坚[1] WANG Shuangzheng;CAO Junsheng;YU Songqun;GAO Zhijian(Changchun Institute of Optics,Fine Mechanics and Physics,Chinese Academy of Sciences,Changchun 130033,China;University of Science and Technology of China,Hefei 230026,China)

机构地区：[1]中国科学院长春光学精密机械与物理研究所,长春130033 [2]中国科学技术大学,合肥230026

出　　处：《激光杂志》2024年第3期30-34,共5页Laser Journal

摘　　要：半导体激光器的电导数和低频电噪声参数可以反映器件的内部缺陷,与器件抗辐照性能具有相关性。介绍了基于电导数技术和低频电噪声技术设计的半导体激光器抗辐照性能检测系统,能够测量并提取激光器电导数及低频电噪声参数。通过微小剂量辐照前后的敏感参数对半导体激光器进行抗辐照性能评价,具有灵敏、无损等优势。The electrical derivative and low-frequency electrical noise parameters of semiconductor lasers can reflect the internal defects of devices and are related to the radiation resistance performance of devices.This thesis introduces a irradiation resistance performance testing system for semiconductor lasers designed based on the electrical derivative and low-frequency electrical noise techniques,which can measure and extract the electrical conductivity and low-frequency electrical noise parameters of lasers.By evaluating the sensitive parameters of semiconductor lasers before and after exposure to small doses of radiation,the irradiation resistance performance can be evaluated with the advantages of sensitivity and non-destructive.

关 键 词：半导体激光器 电导数 低频电噪声 抗辐照性能 无损检测 

分 类 号：TN248[电子电信—物理电子学]