可编程延时器件的批量测试方法研究  

Research on Batch Testing Methods for Programmable Delay Devices

作　　者：赵勇 陈怡 马凯斌 ZHAO Yong;CHEN Yi;MA Kaibin(CEPREI,Guangzhou 511370,China)

机构地区：[1]工业和信息化部电子第五研究所,广东广州511370

出　　处：《电子质量》2024年第3期78-82,共5页Electronics Quality

摘　　要：针对可编程延时器件电参数的实验室测试方法在应用于批量测试时存在的诸多弊端,提出将自动测试系统(ATE)测试和板级测试相结合的方法。以LTC6994型可编程延时器件为例,优化了长延时参数的测试方案,优化后的测试方案相较于优化前缩短了55%的测试时间,V93000测试系统占用时间缩短到原来的1/6,整体测试效率提高了一倍,证明该参数优化方案可以显著提高可编程延时器件电参数的批量测试效率。Aiming at several drawbacks of the laboratory testing methods for electrical parameters of programmable delay devices when applied to batch testing,a method combining ATE level testing and board level testing is proposed.Taking LTC6994 programmable delay devices as an example,the testing plan for long delay parameters is optimized.The optimized testing plan reduces the testing time by 55%compared to before optimization,the V93000 testing system occupies 1/6 of the original time,and the overall testing efficiency has doubled,which proves that this parameter optimization method can significantly improve the batch testing efficiency of programmable delay device electrical parameters.

关 键 词：延时器件 批量测试 自动测试系统测试 板级测试 

分 类 号：TN06[电子电信—物理电子学]