基于半导体制冷的光模块高低温测试系统  

Thermo Electric Cooler Based High and Low Temperature Test System

作　　者：叶宇 张小栋 

机构地区：[1]深圳市恒宝通光电子股份有限公司,广东深圳518000 [2]东莞市恒宝通光电子有限公司,广东东莞523000

出　　处：《工业控制计算机》2024年第4期18-20,共3页Industrial Control Computer

摘　　要：5G网络建设和大规模数据中心建设带来了大量光模块需求。在光模块生产制造中,为了保障光模块在环境温度变化情况下能够长时间正常工作,需要检测模块在不同温度下的性能,而进行高低温测试。高低温测试在光模块制造成本中占了很大比重。设计了一种基于半导体制冷器(Thermo Electric Cooler)的光模块高低温测试系统,相较传统基于热流仪的方案,不需要压缩空气,能够大幅降低功耗、噪声和整体成本,且能够实现与热流仪相当的升降温时间。该系统对于节能减排、降低光模块制造成本有重要意义。Construction of 5G network and large-scale data-center bring huge amount of needs for optical module.In optical module manufacturing,high and low temperature test is necessary to make sure the module works well with the change of temperature in long period.High and low temperature test make up a large proportion of cost in module manufacturing.This paper designs a thermo electric cooler(TEC)based low and high temperature test system.It is free of compressed air with relatively low power consumption,low noise,low cost and similar heat and cooling time compared to the traditional thermo stream based system.It is meaningful for low-cost and low-carbon production of optical module.

关 键 词：光模块 半导体制冷器 高低温测试系统 

分 类 号：TN929.1[电子电信—通信与信息系统] TK124[电子电信—信息与通信工程]