多层球形二次电子测量装置的栅网电子透过率仿真研究  

Simulation study on electron transmittance through grid for a multi-layer spherical secondary electron measurement device

作　　者：刘斯盛 陈宝华 齐鑫 彭卫平[1,2] 杜嘉余 马彦昭 张涛[1] LIU Sisheng;CHEN Baohua;QI Xin;PENG Weiping;DU Jiayu;MA Yanzhao;ZHANG Tao(School of Power and Mechanical Engineering,Wuhan University,Wuhan 430072,China;School of Mechanical and Electrical Engineering,Wuhan Qingchuan University,Wuhan 430204,China;Beijing Institute of Spacecraft Environment Engineering,Beijing 100094,China)

机构地区：[1]武汉大学动力与机械学院,武汉430072 [2]武汉晴川学院机电工程学院,武汉430204 [3]北京卫星环境工程研究所,北京100094

出　　处：《航天器环境工程》2024年第2期219-224,共6页Spacecraft Environment Engineering

基　　金：中国航天科技集团应用创新计划项目(编号:6230114001);可靠性与环境工程技术重点实验室基金项目(编号:6142004210201)。

摘　　要：精确测量材料的二次电子发射系数(SEY)对研究航天器表面材料充放电具有重要意义。在二次电子测量装置中,栅网电子透过率是影响材料SEY测量精度的重要参数。文章通过仿真计算对一种多层球形SEY测量装置中影响栅网电子透过率的因素进行研究,并对栅网网格参数进行优化。结果表明:栅网偏压对栅网电子透过率的影响较小;栅网网格参数是影响栅网电子透过率的主要因素,栅网线径为0.025 mm、格线间距为1 mm时栅网电子透过率达到最大。研究可为优化SEY测量装置设计提供参考。To accurately measure the secondary electron yield(SEY)is of great significance for studying the charge and discharge of spacecraft surface materials.The electron transmittance through grid in the secondary electron measurement device is an important factor affecting the measurement accuracy of the SEY of materials.In this paper,the causes of influencing the electron transmittance through grid in a multi-layer spherical SEY measurement device was simulated by calculation,and the geometry parameters of grid were optimized.The results show that the grid bias exhibits little effect on the electron transmittance through grid,whereas the grid geometry parameters are the main influencing factor.When the grid wire is 0.025 mm in diameter and the grid spacing is 1 mm,the electron transmittance reaches the maximum.The proposed research may provide a reference for optimizing the design of SEY measurement device.

关 键 词：二次电子测量 二次电子发射系数 栅网电子透过率 仿真计算 

分 类 号：O461[理学—电子物理学] P354.4[理学—物理]