电子式电流互感器中的供能激光器退化机理研究  

Study on Degradation Mechanism of Energy-Supplied Laser in Electronic Current Transformer

作　　者：楼钢杰 黄俊昌 夏历[1] LOU Gang-jie;HUANG Jun-chang;XIA Li(School of Optics and Electronic Information,Huazhong University of Science and Technology,Wuhan 430074,China;China Electric Power Research Institute Co.Ltd.,Beijing 100192,China)

机构地区：[1]华中科技大学光学与电子信息学院,湖北武汉430074 [2]中国电力科学研究院有限公司,北京100192

出　　处：《光学与光电技术》2024年第2期100-106,共7页Optics & Optoelectronic Technology

基　　金：国网科技部(5500-202355164A-1-1-ZN)资助项目。

摘　　要：电子式电流互感器中的供能激光器是给远端模块供能的半导体器件。为了解决其故障频发的问题,需要研究其退化机制从而为器件可靠性提升提供可行思路。设计了一套半导体激光器外特性综合测试系统,利用恒温加热箱、振动台可测得在不同温度、振动下的激光器的PIV曲线、波长等外特性参数,并通过相关性分析,表明缓慢退化的关键参数与环境敏感参量的影响机制。其次,对故障光芯片进行失效表征得出供能激光器退化机理。最后对不同退化程度的激光器光功率进行指数拟合得到供能激光器在工况条件下的预期寿命为127438 h,并给出运维改进措施。研究结果表明退化后的激光器斜率效率变化最为显著可达7.99%,阈值电流变化为4.98%,两参量与激光器退化呈现强相关;而芯片退化乃至失效原因主要为腔面膜层损伤不断加剧导致腔面发生光学灾变。The power supply laser in electronic current transformers is a semiconductor device that supplies energy to the remote module.In order to solve the problem of frequent failures,it is necessary to study its degradation mechanism in order to provide feasible ideas for improving device reliability.A comprehensive testing system for the external characteristics of semiconductor lasers is designed.By using a constant temperature heating box and a vibration table,the PIV curve,wavelength and other external characteristic parameters of the laser can be measured at different temperatures and vibrations.Through correlation analysis,the impact mechanism between the key parameters of slow degradation and environmental sensitive parameters is demonstrated.Secondly,the failure characterization of the faulty optical chip is carried out to determine the degradation mechanism of the power supply laser.Finally,exponential fitting is performed on the optical power of lasers with different degrees of degradation to obtain an expected lifespan of 127438 hours under operating conditions,and maintenance improvement measures are proposed.The research results show that the slope efficiency of the degraded laser changes significantly up to 7.99%,and the threshold current changes by 4.98%.The two parameters are strongly correlated with laser degradation.The main reason for chip degradation and even failure is that the damage of the cavity facial mask layer continues to intensify,leading to optical catastrophes on the cavity surface.

关 键 词：半导体激光器 相关性分析 退化机理 电子式电流互感器 光学灾变 

分 类 号：TN248.4[电子电信—物理电子学]