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作 者:孙伟 刘晓宇 SUN Wei;LIU Xiaoyu(The 54th Research Institute of CETC,Shijiazhuang 050081,China)
机构地区:[1]中国电子科技集团公司第五十四研究所,石家庄050081
出 处:《宇航计测技术》2024年第2期39-44,共6页Journal of Astronautic Metrology and Measurement
摘 要:13.2 m反射面天线有口径大、面形精度要求高的特点,并长期经受四季、昼夜温差带来的主反射面形变。针对主反射面承受夏季高温日晒,产生的结构变形,提出了一种主面精度日照变形测量分析方法,利用工业数字摄影测量技术,对主反射面精度进行测量。结果表明,主面最佳拟合精度受温度影响较小,固定坐标系拟合精度受温度影响较大。由于重力变形和高温影响,在俯仰70°工况时,12时和14时主面最佳拟合精度超出了0.3 mm指标,相关试验结果可为同类大口径反射面天线主面精度日照温度变形分析提供参考依据。The characteristics of 13.2 m reflector antenna are large aperture and high surface accuracy requirements,and it has been subjected to long-term deformation of the main reflector caused by seasonal and day-night temperature differences.A measurement and analysis method of sunlight deformation with main surface accuracy is proposed,which measures the accuracy of the main reflector surface using industrial digital photogrammetry technology,in response to the structural deformation caused by the high temperature sunlight in summer.The results show that the best fitting accuracy of the main reflector surface is less affected by the temperature,the fitting accuracy of fixed coordinate system is greatly affected by temperature.Due to the influence of gravity deformation and high temperature,the best fitting accuracy of the main reflector surface at 12:00 and 14:00 exceeds the 0.3 mm index under the condition of elevation of 70°.The relevant experimental results can provide a reference basis for analysis of sunlight deformation with main surface accuracy of similar large aperture reflector antennas.
关 键 词:反射面天线 数字工业摄影测量 面形精度 日照温度变形分析
分 类 号:V414.2[航空宇航科学与技术—航空宇航推进理论与工程] P232[天文地球—摄影测量与遥感]
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