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作 者:彭雅楠 李文栋[1] 曾世胤 张宇程 邓禹 张冠军[1] PENG Yanan;LI Wendong;ZENG Shiyin;ZHANG Yucheng;DENG Yu;ZHANG Guanjun(State Key Laboratory of Electrical Insulation and Power Equipment,Xi’an Jiaotong University,Xi’an 710049,China;China Electric Power Research Institute,Beijing 100192,China)
机构地区:[1]西安交通大学电工材料电气绝缘全国重点实验室,西安710049 [2]中国电力科学研究院有限公司,北京100192
出 处:《高电压技术》2024年第4期1673-1683,共11页High Voltage Engineering
基 金:国家电网有限公司总部管理科技项目(复合外绝缘可靠性评估及沿海地区输电线路污闪特性研究)(5500-202155502A-0-5-ZN)。
摘 要:复合绝缘子中玻璃钢芯棒的酥朽老化现象频繁出现,严重影响了输电线路可靠性。然而,酥朽老化与界面放电的关系尚无明确证据,界面放电下护套粉化对老化的影响仍不明确。文中以内击穿故障而退运绝缘子为参考,搭建了基于界面湿放电的人工加速老化平台,还原了绝缘子的界面放电和芯棒酥朽老化的发生和发展,并模拟了护套ATH填料析出对于酥朽过程的影响。实验在高湿环境下通过界面放电提供酸性和高温条件,在1000 h的老化过程中,对芯棒样品的微观结构、物理化学性质和泄漏电流进行表征。实验结果表明,多因素环境下的复合绝缘子界面放电会引发芯棒中环氧树脂的分解,最终导致玻璃纤维暴露、断裂,形成酥朽老化。同时,由于界面放电导致的护套ATH填料析出行为虽然会加剧芯棒表面老化;但在长期老化过程中,ATH填料可以部分减缓酥朽老化的深入。硅橡胶护套的耐漏电起痕能力对于减缓芯棒酥朽依然有正向效果,使复合绝缘子拥有一定的自修复性。该研究提供了界面放电引发酥朽老化的实验室基础,有助于监测和理解芯棒老化的发展过程和机理,同时从预防和减缓酥朽老化的角度为护套填料配方提供参考。The occurrences of decay-like aging in composite insulators seriously affects the reliability of transmission lines.Clear evidence to prove the effect of housing powdering is still unclear.In this paper,an artificial accelerated aging platform based on interface wet discharge was constructed to reproduce the occurrence and development of decay-like aging,and to simulate the effect of housing aging on core rod decay-like aging.In the experiment,acidic and high temperature conditions were provided through interface discharge in a high humidity environment,and the microscopic structure,physicochemical properties,and leakage current of core rod samples were characterized.The experimental results show that interface discharge in a multi-factor environment can cause the decomposition of core rods.Meanwhile,although the housing filling behavior can exacerbate surface aging of core rods,ATH filling can slow down the aging of core rods during long-term aging.The ability of silicone rubber housing to resist tracking still has a positive effect on reducing core rod decay-like aging.This study provides a laboratory basis for interface discharge-induced decay-like aging,and provides reference for housing filling formula from the perspective of preventing and mitigating decay-like aging.
关 键 词:复合绝缘子 人工加速老化 芯棒酥朽 界面湿放电 护套填料析出
分 类 号:TM216[一般工业技术—材料科学与工程]
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