一种基于CCD的卷绕机对齐度测量补偿方法  

A Automatic Compensation Method for CCD Resolution Measuring System of Lithium Battery Winder Machine

作　　者：罗小军 孙高磊 Luo Xiaojun;Sun Gaolei(Guangdong Tostar Technology Co.,Ltd.,Dongguan,China)

机构地区：[1]广东拓斯达科技股份有限公司,广东东莞

出　　处：《科学技术创新》2024年第9期22-25,共4页Scientific and Technological Innovation

摘　　要：采用CCD实现电芯对齐度检测,设计了一种动态补偿的方法,解决了卷绕机电芯生产过程中因为电芯多层卷绕厚度变化,导致图像成像解析度变化测量结果产生偏差的问题。通过实际验证,结果表明该方法能够有效地提升CCD测量结果同三次元的相关性,将GRR提升到10%以内。Using CCD to detect the alignment of the lithium cell,a dynamic compensation method is designed,which solves the problem that the result of image resolution change measurement is biased due to the change of the core multi-layer winding thickness during the production of the winder core.The results of actual validation show that this method can effectively enhance the correlation between the CCD measurement results and cubic components,and increase the GRR to less than 10%.

关 键 词：卷绕机 解析度补偿 CCD 

分 类 号：TN386.5[电子电信—物理电子学]