基于通用测试平台的AD73360测试子卡设计  

Design of AD73360 test sub-card based on universal test platform

作　　者：于吉刚 侯伟盟 谭加加 YU Jigang;HOU Weimeng;TAN Jiajia(No.58 Research Institute,China Electronics Technology Group Corporation,Wuxi 214035,China)

机构地区：[1]中国电子科技集团公司第58研究所,无锡214035

出　　处：《集成电路与嵌入式系统》2024年第5期88-93,共6页INTEGRATED CIRCUITS AND EMBEDDED SYSTEMS

摘　　要：本文基于中国电子科技集团公司第58所现有的ZYNQ+FPGA的ADC通用测试平台对六通道模/数转换器件AD73360进行详细的动态指标测试,数据处理和分析在上位机LabVIEW中调用MATLAB实现。由于采集控制与处理的平台系统已经设计完成,本设计主要针对AD73360子卡的硬件设计、具体的动态测试方法和上位机指标测试进行详细的阐述,通过对比手册给出的典型动态指标,最终确定本课题设计的子卡性能可以满足AD73360的性能指标要求。Based on the existing ZYNQ+FPGA ADC universal testing platform of the 58th China Electronics Technology Group Corporation,this paper carries out a detailed dynamic index test for the six-channel analog-to-digital conversion device AD73360.Data processing and analysis are realized by invoking MATLAB in LabVIEW of upper computer.As a result of the acquisition control and processing system has been designed,the design is mainly for AD73360 slave card's hardware design,concrete dynamic testing methods and PC by detailed test.Through comparing the manual gives typical dynamic index,the slave card performance can satisfy the performance index of AD73360.

关 键 词：ADC LABVIEW AD73360 动态指标 ZYNQ 

分 类 号：TP23[自动化与计算机技术—检测技术与自动化装置]