去嵌入法计量双阴或双阳接口矢网电子校准件方法的探讨  

Discussion on Measuring a Electronic Calibration Kit with Two Female-ports or Ith Two Male-ports Calibration Method by De-embedding

作　　者：严瑾[1] YAN Jin

机构地区：[1]中国空间技术研究院西安分院计量中心

出　　处：《计量与测试技术》2024年第4期73-75,共3页Metrology & Measurement Technique

摘　　要：本文介绍了去嵌入法,使用矢量网络分析仪检验件计量特殊接口,如双阴或双阳接口电子校准件,避免复杂的数据处理过程。同时,消除夹具对被测校准件的影响,使测量的参考平面从校准网络分析仪转化为测量结果,从而得到特殊接口电子校准件的各S参数值,并验证参数是否符合要求。This paper introduces the de-embedding method,using vector network analyzer to measure special interfaces,such as double negative or double positive interface electronic calibration parts,to avoid complex data processing.At the same time,the influence of the fixture on the measured calibration part is eliminated,so that the measurement reference plane is transformed from the calibration network analyzer to the measurement result,so as to obtain the S-parameter values of the special interface electronic calibration part,and verify whether the parameters meet the requirements.

关 键 词：去嵌入法 检验件 双阴接口电子校准件 双阳接口电子校准件 测量不确定度 

分 类 号：TH89[机械工程—仪器科学与技术]