锥束CT散射校正的平板探测研究  

Research on Flat-Panel Detector for Scatter Correction in Cone-Beam CT

作　　者：罗雪莹 LUO Xueying(Information Technology Department,Zhengzhou College of Finance and Taxation,Zhengzhou,China,450000)

机构地区：[1]郑州财税金融职业学院信息技术系,郑州450000

出　　处：《福建电脑》2024年第5期65-69,共5页Journal of Fujian Computer

摘　　要：为了解决锥束CT在工业CT无损检测中所产生的散射问题,从而提升图像质量,本文提出了一种基于平板探测器的锥束CT散射硬件校正方法。该方法通过在平板探测器BSA上增加散射校正单元,对原始数据进行预处理,从而有效去除散射噪声,以减少散射对锥束CT图像的影响。实验结果表明,该方法能够显著提高锥束CT图像的清晰度和对比度,降低散射对图像质量的影响。In order to solve the scattering problem caused by cone beam CT in industrial CT non-destructive testing and improve image quality.This article proposes a hardware correction method for cone beam CT scattering based on flat panel detectors.This method adds a scattering correction unit to the flat panel detector BSA to preprocess the raw data,effectively removing scattering noise and reducing the impact of scattering on cone beam CT images.The experimental results show that this method can significantly improve the clarity and contrast of cone beam CT images,and reduce the impact of scattering on image quality.

关 键 词：平板探测器 锥束CT 散射校正 图像质量 

分 类 号：TN911.73[电子电信—通信与信息系统]