支持非接触时钟自适应功能测试的仿真器设计  

A Simulator Design Supporting Function Test of Adaptive Clock based on Non-contact Interface

作　　者：王延斌 WANG Yan-bin(CEC Huada Electronic Design Co.,Ltd,Beijing Key Laboratory of RFID Chip Test Technology)

机构地区：[1]北京中电华大电子设计有限责任公司,射频识别芯片检测技术北京市重点实验室

出　　处：《中国集成电路》2024年第5期57-61,共5页China lntegrated Circuit

摘　　要：本文提出了一种支持非接触时钟自适应功能测试的仿真器设计,仿真器通过仿真器管理模块和仿真器硬件实现能量通路选择和能量变化控制,提供给芯片仿真模块变化的能量,以实现芯片时钟自适应功能的测试。本设计支持非接触接口正常通信功能,同时支持能量随机变化的时钟自适应功能测试。通过仿真器内部控制能量大小的变化,不需要人工或自动装置移动设备来改变能量的大小,操作简便节约成本,提高了开发和测试效率。This paper proposes a simulator design supporting function test of adaptive clock based on non-contact interface.The simulator realizes energy-path selection and energy-change control through management module and hardware of the simulator,thereby providing changing energy to the chip simulation module to achieve the function test of adaptive clock.The design supports normal communication function of non-contact interface,and supports clock function test of random energy change.Through the internal control of the simulator,there is no need for manual or automatic device equipment to change the scale of the energy,which is simple to operate,save cost,as well as improves the efficiency of development and test.

关 键 词：场强能量 时钟自适应 非接触接口 

分 类 号：TN40[电子电信—微电子学与固体电子学] TP391.9[自动化与计算机技术—计算机应用技术]