一种数模混合芯片高效量产测试技术研究  

Research on High Efficiency Test Technology of Mixed Signal Chip in Mass Production

作　　者：奚留华 唐彩彬 张凯虹 武乾文 王一伟 XI Liu-hua;TANG Cai-bin;ZHANG Kai-hong;WU Qian-wen;WANG Yi-wei(Wuxi CMC Electronics Co.Ltd)

机构地区：[1]无锡中微腾芯电子有限公司

出　　处：《中国集成电路》2024年第5期89-93,共5页China lntegrated Circuit

摘　　要：以提高数模混合芯片量产测试效率为目的,基于数模混合芯片的测试参数和功能进行分析,对现有的量产测试方案进行技术优化和提升。对数字参数和模拟参数同时测试的技术方案进行优化,分别针对数字模块、模拟模块设计硬件,开发测试程序,数字模块测试SITE数提高至20 SITES同测。针对模拟模块的个性化熔丝修调方案进行优化,通过设计通用的熔丝修调阵列装置,避免重复设计熔丝修调板卡,缩短电路板(PCB)设计、制造时间。针对集成电路的测试数据进行分析,提出基于应用程序可视化基础(VBA)结合公式计算的集成电路数据筛选方法,提高集成电路测试质量。通过上述技术方案优化,数模混合芯片的量产测试效率提升了50%以上。In order to improve the efficiency of mass production test of mixed signal chip,the test parameters and functions of mixed signal chip were analyzed.The existing mass production test scheme was optimized and improved.The technical scheme of simultaneous testing of digital parameters and analog parameters is optimized.Hardware of digital module and analog module is designed respectively.Testing programs of digital module and analog module is developed respectively.The number of digital module test sites is increased to 20 SITES.To optimize the fuse trimming scheme of analog module,by designing a universal fuse trimming array device,the repetitive design of fuse trimming board is avoided,and the design and manufacturing time of PCB is shortened.Based on the analysis of IC test data,a method of data screening for integrated circuits based on Visual Basic for Applications and formula calculation is proposed.Through the optimization of the above technical solutions,the mass production test efficiency of the mixed signal chip was increased by more than 50%.

关 键 词：数模混合芯片 测试效率 熔丝修调 测试数据 

分 类 号：TN407[电子电信—微电子学与固体电子学]