电子式漏电断路器分段寿命预测方法研究  

Segment life prediction of electronic leakage circuit breaker

作　　者：石颉 孔令崧 孙浩 胡立新 SHI Jie;KONG Lingsong;SUN Hao;HU Lixin(School of Electronic&Information Engineering,Suzhou University of Science and Technology,Suzhou215009,Jiangsu Province,China)

机构地区：[1]苏州科技大学电子与信息工程学院,江苏苏州215009

出　　处：《电子元件与材料》2024年第4期497-504,共8页Electronic Components And Materials

摘　　要：传统寿命预测使用Arrhenius方程计算的平均活化能来反映断路器老化速率,并据此计算断路器的使用寿命。这种做法忽视了各电子部件的老化程度在老化不同时期中的差异,从而无法准确地反映断路器的整体老化速率。对此,提出了一种基于Arrhenius方程的分段式寿命预测方法,该方法使用剩余动作电流作为老化特征参数,并将整个老化过程分段,通过各阶段在不同温度应力条件下的老化时间,计算各阶段平均表观活化能,从而计算阶段寿命,最后将各阶段的寿命相累加,得到断路器的寿命预测结果。该方法更加符合真实情况下的漏电断路器,预测结果更加接近实际寿命。Traditional life prediction method uses average activation energy in the Arrhenius equation to calculate the aging rate and life span of circuit breaker.This method ignores the difference in the aging degree of each component in different aging periods,which leads to miscalculation of overall aging rate.In this regard,a segmented life prediction method was proposed based on the Arrhenius equation.Using the residual action current as the aging parameter,the whole aging process was segmented,and the aging time of each segment was calculated under different temperature and stress conditions.Using previous calculations,the average apparent activation energy was calculated for each segment.Finally,the life of each segment was accumulated to predict the whole life span.This method is more consistent with the actual leakage circuit breaker,and the predicted results are closer to its actual life span.

关 键 词：漏电断路器 加速老化实验 寿命预测 表观活化能 

分 类 号：TM561[电气工程—电器]