Stimulated emission-depletion-based point-scanning structured illumination microscopy  

作　　者：汪磊 王美婷 王璐玮 郑晓敏 陈嘉杰 吴文帅 严伟 于斌 屈军乐 高志 邵永红 Lei Wang;Meiting Wang;Luwei Wang;Xiaomin Zheng;Jiajie Chen;Wenshuai Wu;Wei Yan;Bin Yu;Junle Qu;Bruce Zhi Gao;Yonghong Shao(Guangdong Key Laboratory for Biomedical Measurements and Ultrasound Imaging,National-Regional Key Technology Engineering Laboratory for Medical Ultrasound,School of Biomedical Engineering,Shenzhen University Medical School,Shenzhen 518060,China;Key Laboratory of Opto-electronic Information Science and Technology of Jiangxi Province,Nanchang Hangkong University,Nanchang 330063,China;College of Physics and Optoelectronics Engineering,Key Laboratory of Optoelectronic Devices and Systems of Ministry of Education and Guangdong Province,Shenzhen University,Shenzhen 518060,China;Department of Bioengineering and COMSET,Clemson University,Clemson SC 29634,US)

机构地区：[1]Guangdong Key Laboratory for Biomedical Measurements and Ultrasound Imaging,National-Regional Key Technology Engineering Laboratory for Medical Ultrasound,School of Biomedical Engineering,Shenzhen University Medical School,Shenzhen 518060,China [2]Key Laboratory of Opto-electronic Information Science and Technology of Jiangxi Province,Nanchang Hangkong University,Nanchang 330063,China [3]College of Physics and Optoelectronics Engineering,Key Laboratory of Optoelectronic Devices and Systems of Ministry of Education and Guangdong Province,Shenzhen University,Shenzhen 518060,China [4]Department of Bioengineering and COMSET,Clemson University,Clemson SC 29634,US

出　　处：《Chinese Optics Letters》2024年第3期95-100,共6页中国光学快报（英文版）

基　　金：supported by the National Natural Science Foundation of China(Nos.62275168,62275164,61775148,and 61905145);the National Key Research and Development Program of China(No.2022YFA1206300);the Guangdong Natural Science Foundation and Province Project(Nos.2021A1515011916 and 2023A1515012250);the Foundation from Department of Science and Technology of Guangdong Province(No.2021QN02Y124);the Foundation from Department of Education of Guangdong Province(No.2023ZDZX2052);the Shenzhen Science and Technology R&D and Innovation Foundation(No.JCYJ20200109105608771);the Shenzhen Key Laboratory of Photonics and Biophotonics(No.ZDSYS20210623092006020);the Medical-Engineering Interdisciplinary Research Foundation of Shenzhen University。

摘　　要：Wide-field linear structured illumination microscopy(LSIM)extends resolution beyond the diffraction limit by moving unresolvable high-frequency information into the passband of the microscopy in the form of moiréfringes.However,due to the diffraction limit,the spatial frequency of the structured illumination pattern cannot be larger than the microscopy cutoff frequency,which results in a twofold resolution improvement over wide-field microscopes.This Letter presents a novel approach in point-scanning LSIM,aimed at achieving higher-resolution improvement by combining stimulated emission depletion(STED)with point-scanning structured illumination microscopy(ps SIM)(STED-ps SIM).The according structured illumination pattern whose frequency exceeds the microscopy cutoff frequency is produced by scanning the focus of the sinusoidally modulated excitation beam of STED microscopy.The experimental results showed a 1.58-fold resolution improvement over conventional STED microscopy with the same depletion laser power.

关 键 词：stimulated emission depletion structured illumination microscopy superresolution microscopy 

分 类 号：TH742[机械工程—光学工程]