心脏电子装置植入术后新发心房高频事件相关因素的研究进展  

Related factors of new atrial high frequency events after cardiac electronic device implantation

作　　者：王鑫[1] 张展 刘铎 李燕玲[2] 闫恒瑜 谢萍[2] WANG Xin;ZHANG Zhan;LIU Duo;LI Yanling;YAN Hengyu;XIE Ping(The First Clinical Medical College of Gansu University of Traditional Chinese Medicine,Lanzhou,730000,China;Department of Cardiology,Gansu Provincial People's Hospital)

机构地区：[1]甘肃中医药大学第一临床医学院,兰州730000 [2]甘肃省人民医院心内科

出　　处：《临床心血管病杂志》2024年第4期281-285,共5页Journal of Clinical Cardiology

基　　金：甘肃省人民医院院内科研基金青年培育项目(No:23GSSYF-29)。

摘　　要：植入心脏植入式电子设备可以检测心房高频事件发生,也可以增加心房高频事件的发病率。心房高频事件与卒中的风险增加相关,但是关于早期识别心房高频事件的危险因素或预测因子的相关研究较少,使得我们不能尽早评估和干预卒中高风险人群,进而减少急性脑卒中事件的发生。本文从心房高频事件的定义、发病率和术后新发心房高频事件的相关因素等方面进行综述,以期为早期识别术后心房高频事件高危患者提供理论支持。Implantation of cardiac implantable electronic devices can detect the occurrence of atrial high rate events,and can also increase the incidence rate of atrial high rate events.Atrial high rate events are associated with an increased risk of stroke,but there is limited research on early identification of risk factors or predictive factors for atrial high rate events,making it difficult to assess and intervene in high-risk stroke populations as early as possible,thereby reducing the occurrence of acute stroke events.This article reviews the definition of atrial high rate events,incidence rate and related factors of new atrial high rate events after surgery,in order to provide theoretical support for early identification of high-risk patients with atrial high rate events after surgery.

关 键 词：心房高频事件 心脏电子植入式设备 危险因素 预测因素 

分 类 号：R541.7[医药卫生—心血管疾病]