基于ADS的微系统电源完整性仿真及优化  

PI simulation and optimization of microsystem based on ADS

作　　者：吕超华 李庆忠 时广轶 Lv Chaohua;Li Qingzhong;Shi Guangyi(School of Mechanical Engineering,Jiangnan University,Wuxi 214122,China;Wuxi Beiwei Sensing Technology Co.,Ltd.,Wuxi 214072,China)

机构地区：[1]江南大学机械工程学院,江苏无锡214122 [2]无锡北微传感科技有限公司,江苏无锡214072

出　　处：《电子技术应用》2024年第5期7-12,共6页Application of Electronic Technique

摘　　要：随着芯片制造技术和封装技术的发展,电子产品内部的器件集成度和信号速度在持续提高,微系统成为一种新兴的形式,这导致了对电源完整性的要求不断提高。不合理的电源完整性设计将会给电源质量和信号质量带来极大的干扰,甚至会使系统崩溃。针对所设计的多芯片微系统设计进行了电源完整性的仿真,并利用基板、PCB去耦电容网络协同去耦的方式对电源分配网络阻抗进行了优化,解决了微系统内部的空间有限与去耦电容需求量大的矛盾,保证了微系统的电源完整性。With the development of chip manufacturing technology and packaging technology,the device integration and signal speed inside electronic products continue to increase,and microsystems become an emerging form,which leads to increasing requirements for power integrity.Unreasonable power supply integrity design will bring great interference to power quality and signal quality,and even make the system collapse.In this paper,the power supply integrity of the designed multi-chip microsystem was simulated,and the PDN impedance was optimized by the collaborative decoupling of substrate and PCB decoupling capacitor network,which solved the contradiction between the limited space inside the microsystem and the large demand for decoupling capacitor,and ensured the power supply integrity of the microsystem.

关 键 词：电源完整性 电源分配网络 阻抗 去耦电容 

分 类 号：TN402[电子电信—微电子学与固体电子学]