医疗器械产品电快速瞬变脉冲群的抗扰度研究  

Electrical Fast Transient/B Immunity Research of Medical Devices

作　　者：李富同 Li Futong

机构地区：[1]鹏睿检测技术(上海)有限公司

出　　处：《安全与电磁兼容》2024年第3期87-92,共6页Safety & EMC

摘　　要：文章深入研究了医疗器械产品的注册检验中最常出现的电快速瞬变脉冲群干扰问题,详细分析了干扰来源、干扰特性和频谱特征,采用了试验结果对比及理论分析的方法,针对不同端口提出了对应解决的方案,特别提出了针对电路板的设计要求,很好解决了电快速瞬变的试验干扰问题,对提升医疗器械产品的抗快速瞬变脉冲干扰设计有较好的参考价值。This paper deeply analyzes the interference topic of Fast Transient/Burst for medical devices during medical equipment register inspection practice,which is most common issue,describes its source,characteristic of Interference&its spectrum.This paper compares the experiment result,analyzes the theory,and proposes the corresponding solution for different test ports of product,especially the PCBA Design guideline,which can help medical device pass the EFT/B test well.It's very meaningful for improving interference&reliability design level for medical devices.

关 键 词：医疗器械 电快速瞬变脉冲群 电磁兼容 

分 类 号：TN9[电子电信—信息与通信工程]