X荧光光谱仪真空度偏高故障率的原因与对策  

Causes and Countermeasures of High Vacuum Failure Rate of X-ray Fluorescence Spectrometer

作　　者：陈晗雪 CHEN Hanxue(Jinlong Copper Industry Co.,Ltd.,Tongling Anhui 244000)

机构地区：[1]金隆铜业有限公司,安徽铜陵244000

出　　处：《中国科技纵横》2024年第4期68-73,共6页China Science & Technology Overview

摘　　要：利用统计方法对X荧光光谱仪故障的产生原因进行分析,探究造成X荧光光谱仪故障率的主要因素。通过逐层次分析得知,真空度偏高是真空系统故障的主要因素。对真空度偏高故障率的原因进行分析,从密封样品罐的麦拉膜更换、制样压片压力、过滤网清洗频次、密封环更换频次、泵油更换频次、人员综合素质六个方面入手,通过试验找出各因素对真空度偏高故障率的影响程度,根据影响程度得到导致真空度偏高故障的症结。制样压片压力低、密封环使用时间过长是影响X荧光光谱仪真空度偏高的主要因素,采取增大压片压力、加大更换密封环频次等方法,降低了真空度偏高故障率,保障了样品分析的稳步进行,提高了化验的精准度,及时为生产提供数据支持,获得了一定的经济效益和社会效益。Using statistical methods to analyze the causes of X-ray fluorescence spectrometer failures,the main factor causing the failure rate of the X-ray fluorescence spectrometer is the failure of the vacuum system,and then through layer-by-layer analysis,it is found that high vacuum degree is the main factor of vacuum system failure.Analyze the reasons for the high failure rate of the vacuum degree,from the impact of untimely replacement of the Mylar membrane of the sealed sample tank,the influence of sample preparation pressure,the influence of filter cleaning frequency,the impact of the frequency of seal ring replacement,the influence of the frequency of pump oil replacement,starting from six aspects of the impact of the comprehensive quality of personnel,find out the degree of influence of various factors on the failure rate of high vacuum degree through experiments,according to the degree of influence,the crux of the fault leading to high vacuum degree is obtained.The pressure of sample preparation is low,the long service time of the sealing ring is the main factor affecting the high vacuum of the X-ray fluorescence spectrometer,take increased tablet pressure,the countermeasure of increasing the frequency of replacing the sealing ring reduces the failure rate of high vacuum degree,guaranteed the steady progress of sample analysis,improve the accuracy of the assay,provide timely data support for production,obtained certain economic and social benefits.

关 键 词：真空度偏高故障率 压片压力 密封环 

分 类 号：TH744.16[机械工程—光学工程]