检索规则说明:AND代表“并且”;OR代表“或者”;NOT代表“不包含”;(注意必须大写,运算符两边需空一格)
检 索 范 例 :范例一: (K=图书馆学 OR K=情报学) AND A=范并思 范例二:J=计算机应用与软件 AND (U=C++ OR U=Basic) NOT M=Visual
作 者:Zhiwen Shu Bo Feng Peng Liu Lei Chen Huikang Liang Yiqin Chen Jianwu Yu Huigao Duan
机构地区:[1]College of Mechanical and Vehicle Engineering,National Engineering Research Centre for High Efficiency Grinding,Hunan University,Changsha 410082,People’s Republic of China [2]Greater Bay Area Institute for Innovation,Hunan University,Guangzhou 511300,People’s Republic of China [3]School of Mechanical Engineering,Hunan University of Science and Technology,Xiangtan 411201,People’s Republic of China [4]Shenzhen Research Institute,Hunan University,Shenzhen 518000,People’s Republic of China
出 处:《International Journal of Extreme Manufacturing》2024年第1期313-326,共14页极端制造(英文)
基 金:supported by the National Key Research and Development Program of China(No.2022YFB4602600);the National Natural Science Foundation of China(No.52221001);Hunan Provincial Innovation Foundation for Postgraduate(No.CX20220406)。
摘 要:There is an urgent need for novel processes that can integrate different functional nanostructures onto specific substrates,so as to meet the fast-growing need for broad applications in nanoelectronics,nanophotonics,and fexible optoelectronics.Existing direct-lithography methods are difficult to use on fexible,nonplanar,and biocompatible surfaces.Therefore,this fabrication is usually accomplished by nanotransfer printing.However,large-scale integration of multiscale nanostructures with unconventional substrates remains challenging because fabrication yields and quality are often limited by the resolution,uniformity,adhesivity,and integrity of the nanostructures formed by direct transfer.Here,we proposed a resist-based transfer strategy enabled by near-zero adhesion,which was achieved by molecular modification to attain a critical surface energy interval.This approach enabled the intact transfer of wafer-scale,ultrathin-resist nanofilms onto arbitrary substrates with mitigated cracking and wrinkling,thereby facilitating the in situ fabrication of nanostructures for functional devices.Applying this approach,fabrication of three-dimensional-stacked multilayer structures with enhanced functionalities,nanoplasmonic structures with~10 nm resolution,and MoS2-based devices with excellent performance was demonstrated on specific substrates.These results collectively demonstrated the high stability,reliability,and throughput of our strategy for optical and electronic device applications.
关 键 词:resist-based transfer printing near-zero adhesion critical surface energy wafer-scale nanofabrication in situ fabrication optoelectronic devices
分 类 号:TB383.1[一般工业技术—材料科学与工程]
正在载入数据...
正在载入数据...
正在载入数据...
正在载入数据...
正在载入数据...
正在载入数据...
正在载入数据...
正在链接到云南高校图书馆文献保障联盟下载...
云南高校图书馆联盟文献共享服务平台 版权所有©
您的IP:18.216.130.198