红外发射管结构可靠性工艺的研究与应用  

Research and Application of Reliability Technology of Infrared Emission Tube Structure

作　　者：蔡伟达 欧阳欢 于海川 乔福力 

机构地区：[1]TCL空调器(中山)有限公司,中山528427

出　　处：《日用电器》2024年第5期69-73,共5页ELECTRICAL APPLIANCES

摘　　要：红外发光二极管作为遥控器的主要发射元件,其质量将影响遥控器的使用性能及客户的满意度,结合实际应用中的失效现象,研究红外发射管在使用过程中出现的常见内部银胶应力失效问题。通过解剖呈现银胶应力失效的具体内部形态,并阐述常见失效的影响因素,其中包括反光杯结构、银胶结合剂、支架等。根据实际生产使用过程中,识别影响以上几个因素的关键控制因子,并探讨通过采取哪些工艺防护措施来提升红外发射管的结构可靠性。Infrared light-emitting diode as the main transmitter of the remote control,its quality will affect the performance of the remote control and customer satisfaction,combined with the practical application of thefailure phenomenon,the common internal silver glue stress failure of the infrared emitter tube in the use of the problem.The specific internal morphology of stress failure of silver glue was presented by anatomy,and the influencing factors of common failure were described,including the structure of reflective cup,silver cementing agent,and support.According to the actual production process,the key control factors affecting the above factors are identified,and the process protection measures are discussed to improve the structural reliability of infrared emission tube.

关 键 词：红外发射管 反光杯结构 银胶应力 支架应力 

分 类 号：TP872[自动化与计算机技术—检测技术与自动化装置] TN31[自动化与计算机技术—控制科学与工程]