Mitigating set-stuck failure in 3D phase change memory:substituting square pulses with surge pulses  

作　　者：Ninghua LI Wang CAI Jun XIANG Hao TONG Weiming CHENG Xiangshui MIAO 

机构地区：[1]School of Integrated Circuits,Huazhong University of Science and Technology,Wuhan 430074,China [2]Hubei Yangtze Memory Laboratories,Wuhan 430205,China [3]Hubei Institute of Measurement and Testing Technology,Wuhan 430205,China

出　　处：《Science China(Information Sciences)》2024年第5期291-297,共7页中国科学（信息科学）（英文版）

基　　金：supported by National Key R&D Program of China (Grand No. 2021YFA1202804);National Natural Science Foundation of China (Grant No. 62174065);Hubei Provincial Natural Science Foundation of China (Grant No. 2021CFA038);the support from Hubei Key Laboratory of Advanced Memories & Hubei Engineering Research Center on Microelectronics

摘　　要：In the devices that integrate phase change memory(PCM)and ovonic threshold switching(OTS),the OTS threshold voltage often surpasses the RESET operation voltage of PCM.The conventional application of square pulses hinders the successful completion of the SET operation in these integrated devices.To address this challenge,a novel pulse called the surge pulse is introduced,which comprises a high amplitude pulse for OTS activation and a low amplitude pulse for PCM operation.By employing COMSOL simulation,the operational effectiveness of both square pulses and surge pulses is validated.Test results reveal that using a square pulse to operate the integrated device accelerates the occurrence of SET-stuck failure(SSF).In contrast,the surge pulse enables the integrated device to operate for at least 1000 cycles while preserving the essential cyclic characteristics.Additionally,an investigation into the overshoot component of the surge pulse is conducted,revealing that an increase in overshoot amplitude and pulse width also accelerates the emergence of SSF.By applying the theory of ion migration induced by the electric field,the root cause of SSF in integrated devices is explained,and the accuracy of the theory is validated through the application of a reverse pulse.In summary,this study elucidates the rationality of replacing the square pulse with a surge pulse,presenting a superior approach for operating PCM and OTS integrated devices.

关 键 词：surge pulse phase change memory(PCM) integration SET-stuck failure(SSF) square pulse 

分 类 号：TP333[自动化与计算机技术—计算机系统结构]