内置测试BIT设计的可靠性分析  

Analysis of Reliability of Built in Test BIT Design

作　　者：赵龙飞[1] 刘洋[1] 周永明[1] ZHAO Longfei;LIU Yang;ZHOU Yongming(Beijing Institute of Aerospace Launch Technology,Beijing 100076,China)

机构地区：[1]北京航天发射技术研究所,北京100076

出　　处：《电子技术（上海）》2024年第3期338-339,共2页Electronic Technology

摘　　要：阐述内置测试(BIT)系统的设计原理、可靠性分析以及性能评估方法,探讨系统在各个关键应用领域中的重要性和应用范围。通过具体案例和数据分析,展示BIT系统的性能特点和可靠性。This paper expounds the design principles, reliability analysis, and performance evaluation methods of built-in testing(BIT) systems, and explores the importance and application scope of the system in various key application fields. Through specific cases and data analysis, it demonstrates the performance characteristics and reliability of the BIT system.

关 键 词：内置测试BIT 可靠性分析 性能评估 

分 类 号：TP277[自动化与计算机技术—检测技术与自动化装置]